Investigation of post-metallization annealing condition on the ferroelectric HfN1.15 thin film formation ○Kangbai Li・Shun-ichiro Ohmi(Tokyo Tech.) SDM2024-49
A study on Ar/N2-plasma sputtering gas pressure dependence on the LaBxNy insulator formation for non-volatile memory applications ○Eun-Ki Hong・Shun-ichiro Ohmi(Tokyo Tech.) SDM2021-46