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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
R |
2012-06-15 13:15 |
Tokyo |
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Study on Prevention of Trouble by Structure Analysis of LSI
-- The efforts for the reliability improvement of the electronic components for power plant -- Kazuya Murakami, Yuichi Sumimoto (Toshiba) R2012-11 |
Electronic components to be applied to industrial products, it is necessary to be highly reliable. However, since the hi... [more] |
R2012-11 pp.1-5 |
R |
2007-09-14 15:00 |
Kochi |
Kochi Univ. of Technology |
The failure analyses and the article of good quality analysis of the electronic component
-- The efforts for the reliability improvement of the electronic component which is for automobile use -- Yasuo Imai, Daiki Tanaka (OEG) R2007-35 |
In recent years, that the electronic component, which is for automobile use, is important is rising rapidly. It got to u... [more] |
R2007-35 pp.35-39 |
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