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All Technical Committee Conferences (Searched in: All Years)
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Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
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Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
SDM |
2024-02-21 15:50 |
Tokyo |
Tokyo University-Hongo-Engineering Bldg.4 (Primary: On-site, Secondary: Online) |
[Invited Talk]
Recent Studies of WoW and CoW Cu-Cu Hybrid Bonding Yoshihisa Kagawa, Yukako Ikegami, Takahiro Kamei, Hayato Iwamoto (SSS) SDM2023-87 |
In recent years, a variety of 3D stacked devices have been proposed. The Cu-Cu hybrid bonding that can realize high dens... [more] |
SDM2023-87 pp.31-35 |
SDM |
2016-01-22 14:35 |
Tokyo |
Sanjo Conference Hall, The University of Tokyo |
[Invited Talk]
Effect of Wafer Thinning on DRAM Characteristics for Bumpless Interconnects and WOW Applications Y. S. Kim, S. Kodama, Y. Mizushima, T. Nakamura, N. Maeda, K. Fujimoto (Tokodai), A. Kawai (DISCO), T. Ohba (Tokodai) SDM2015-116 |
(To be available after the conference date) [more] |
SDM2015-116 pp.33-37 |
EMCJ |
2011-11-25 15:15 |
Tokyo |
Univ. of Electro-Communiations |
Resent malfunctions and mitigations of telecommunication installations Kazuo Murakawa, Kei Tominaga, Yuichiro Okugawa, Yasunori Ogura, Hidenori Itou (NTT EAST) EMCJ2011-93 |
Recently, more than 70% malfunctions (noise sound on telephone sets, link dropping on ADSL modem etc) are occurred at cu... [more] |
EMCJ2011-93 pp.31-36 |
ICD, SDM |
2010-08-27 10:15 |
Hokkaido |
Sapporo Center for Gender Equality |
[Invited Talk]
Development of sub-10um Thinning Technology using Actual Device Wafers Nobuhide Maeda, Kim Youngsuk (Univ. of Tokyo), Yukinobu Hikosaka, Takashi Eshita (FSL), Hideki Kitada, Koji Fujimoto (Univ. of Tokyo), Yoriko Mizushima (Fujitsu Labs.), Kousuke Suzuki (DNP), Tomoji Nakamura (Fujitsu Labs.), Akihito Kawai, Kazuhisa Arai (DISCO), Takayuki Ohba (Univ. of Tokyo) SDM2010-141 ICD2010-56 |
200-mm and 300-mm device wafers were successfully thinned down to less than 10-μm. A 200-nm non-crystalline layer remain... [more] |
SDM2010-141 ICD2010-56 pp.95-97 |
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