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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2023-09-28 14:20 |
Fukuoka | (Primary: On-site, Secondary: Online) |
Copula models based on left-truncated and competing risks data
-- Likelihood inference based on field studies -- Takeshi Emura (ISM), Hirofumi Michimae (Kitasato Univ.)  R2023-39 |
In the collection method of failure data (field life data) in field tests, unobserved failure occurs before the collecti... [more] | R2023-39 pp.12-15 |
| CPSY, DC, IPSJ-ARC [detail] | 2023-08-03 09:00 |
Hokkaido | Hakodate Arena (Primary: On-site, Secondary: Online) |
Proposal of Data Protection Features using Peak Shift Method of Drive Failure Risk Takaki Nakamura (Tohoku Univ.), Hitoshi Kamei (Kagawa Univ.) CPSY2023-8 DC2023-8 |
We propose a peak shift method for data protection that considers time-series changes in drive failure risk and the risk... [more] | CPSY2023-8 DC2023-8 pp.1-6 |
| R | 2021-10-22 14:25 |
Online | Online | [Invited Talk]
Field Lifetime Data Analysis with Left-truncation and Right-censoring
-- Statistical Inference and Reliability Prediction based on Parametric Models -- Takeshi Emura (Kurume Univ.), Hirofumi Michimae (Kitasato Univ.) R2021-31 |
In applications of reliability analyses, a dataset may be collected during a period of time to observe failure events. L... [more] | R2021-31 pp.7-12 |
| LQE, OPE, CPM, EMD, R | 2019-08-22 16:00 |
Miyagi | [Invited Talk]
Reconsideration of TDDB Statistics of Thick Dielectric Films Used in SiC/GaN Power/RF Devices and Image Sensors Kenji Okada (TowerJazz Panasonic Semiconductor) R2019-25 EMD2019-23 CPM2019-24 OPE2019-52 LQE2019-30 |
Recent advances of GaN/SiC power devices, RF/MMIC (monolithic microwave integrated circuit) devices, and also Image Sens... [more] | R2019-25 EMD2019-23 CPM2019-24 OPE2019-52 LQE2019-30 pp.29-34 |
|
| R | 2016-11-17 14:00 |
Osaka | Osaka Central Electric Club Bldg. | Estimation of three parameters of Weibull distribution by a discretization mdel Kenji Uogishi R2016-49 |
It is divided in fixed period of time such as days or months and the statistics information that the observation numeric... [more] | R2016-49 pp.1-6 |
| R | 2016-11-17 14:25 |
Osaka | Osaka Central Electric Club Bldg. | Software Reliability Analysis Based on Machine Learning Toru Kaise (Univ. of Hyogo) R2016-50 |
Software debugging processes are made to be effective by managing methods with reliability evaluations. The reliability ... [more] | R2016-50 pp.7-11 |
| EMD | 2015-11-05 16:25 |
Miyagi | Tohoku University, School of engineering, Aoba memorial hall | Behavior of Terminal Resistance and Deterioration Prediction of Terminal Resistance with Connectors Used in Long Driven Vehicles Shigeru Sawada, Atsushi Shimizu, Yasushi Saitoh (ANtech) EMD2015-72 |
It is an important issue to investigate the deterioration state of connectors used in long driven vehicles in order to d... [more] | EMD2015-72 pp.29-34 |
| EMCJ, EMD | 2015-07-10 16:20 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | [Special Talk]
Required for Investigation on Functional Safety (1)
-- Outline -- Takeshi Aoki, Kenjiro Hamada (Yaskawa Control), Nobuhisa Oikawa (TE), Kazuya Yokoyama (OSDC) EMCJ2015-52 EMD2015-29 |
Recently, safety requirements, functional safety standards and their basic parameter; reliability standards have been pa... [more] | EMCJ2015-52 EMD2015-29 pp.47-51 |
| R | 2013-12-13 14:35 |
Tokyo | A Comparative Study of NHPP-based Software Reliability Models with Exponentiated Distributions Xiao Xiao (Tokyo Metropolitan Univ.), Tadashi Dohi (Hiroshima Univ.) R2013-82 |
The non-homogeneous Poisson processes (NHPPs) based software reliability models (SRMs) have gained much popularity in ac... [more] | R2013-82 pp.19-24 |
|
| R | 2012-05-25 15:45 |
Shimane | On the Role of Weibull-type Distributions in Binomial Software Reliability Modeling Xiao Xiao, Tadashi Dohi (Hiroshima Univ.) R2012-7 |
The binomial software reliability model (SRM) is one of the most classical but plausible SRMs, and can describe many sof... [more] | R2012-7 pp.35-40 |
|
| EMD, R | 2011-02-18 15:50 |
Shizuoka | Shizuoka Univ. (Hamamatsu) | Statistical Quality Control based on Early Life Failure Rate for Electronic Components Toshinari Matsuoka (MELCO) R2010-48 EMD2010-149 |
Basically, a manufacturing process of electronic components is complex and demanding.Therefore, in order to achieve a qu... [more] | R2010-48 EMD2010-149 pp.37-42 |
| SANE | 2011-01-27 16:25 |
Nagasaki | Nagasaki Prefectural Art Museum | A Study on Simulation for Clutter Suppression for UWB Vehicle Radar at 24GHz Isamu Matsunami, Masatoshi Ogata, Masami Kawazoe, Yoshio Kosuge (Nagasaki Univ.), Akihiro Kajiwara (Kitakyushu Univ.) SANE2010-145 |
Recent year, 24/26GHz UWB radar is attracting the attention as short-range and wide-angle radar, which achieve surround ... [more] | SANE2010-145 pp.43-47 |
| R | 2010-12-17 13:50 |
Tokyo | Analysis of field failure data in a limited period observation Dongya Xu, Kazuyuki Suzuki (UEC) R2010-39 |
Now, saving cost is the first target to every company in the situation of ruducing the risk of economicand financial dis... [more] | R2010-39 pp.13-15 |
|
| WBS, ITS (Joint) |
2010-12-06 10:25 |
Ibaraki | AIST | Improvement of Target Detection Performance Considering Clutter Characteristics for UWB Vehicle Radar at 24GHz Isamu Matsunami (Nagasaki Univ.), Akihiro Kajiwara (Kitakyushu Univ.) WBS2010-36 |
Radar echo contains unwanted echoes called as clutter, which make it difficult to detect some obstacle or target. Theref... [more] | WBS2010-36 pp.7-11 |
| R | 2010-05-28 12:55 |
Tottori | Reliability data analysis for quality improvement of automotive rubber products Naofumi Wada, Ryoma Takagi, Shigeru Yamada (Tottori Univ.) R2010-8 |
In this paper, we discuss the materials which called “Resin slide materials” which use on a glass-run-channel for automo... [more] | R2010-8 pp.7-12 |
|
| R | 2009-07-31 16:00 |
Hokkaido | A Study of Estimation for the Three-ParameterWeibull Distribution under Singly Censored Data Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.), Tsunenori Ishioka (NCUEE), Hisashi Yamamoto (Tokyo Metropolitan Univ.) R2009-30 |
Efficient methods for parameter estimation of the three-parameter Weibull distribution under censored data have not exis... [more] | R2009-30 pp.47-51 |
|
| EMD | 2009-07-17 15:20 |
Hokkaido | Chitose Arcadia Plaza | An experimental study on analysis of contact resistance data with Weibull distribution function Makoto Hasegawa (Chitose Inst. of Sci. and Tech.) EMD2009-25 |
In order to realize detailed analysis of measured contact resistance data, fitting of Weibull distribution function to c... [more] | EMD2009-25 pp.25-30 |
| R | 2008-06-20 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A consideration on estimation of the Weibull parameters Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.) R2008-16 |
Two methods for parameter estimation of the three-parameter Weibull distribution are proposed. In the both methods, the ... [more] | R2008-16 pp.9-14 |
| R | 2007-07-13 14:55 |
Hokkaido | Kitami Institute of Technology | Two-Dimensional Software Reliability Growth Modeling based on a Weibull Process Shinji Inoue, Shigeru Yamada (Tottori Univ.) R2007-26 |
Almost all of the software reliability growth models (SRGMs) has been developed under the assumption that the software r... [more] | R2007-26 pp.39-44 |
| R, SSS | 2006-12-15 14:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Parameter estimation for lifetime distributions free from location information Hideki Nagatsuka (Tokyo Metropolitan Univ.) |
Weibull distribution and gamma distribution, having location (threshold), scale and shape parameters, are used as models... [more] | R2006-43 SSS2006-24 pp.25-30 |
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