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All Technical Committee Conferences (Searched in: Recent 10 Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| DC | 2020-12-11 13:00 |
Hyogo | (Primary: On-site, Secondary: Online) |
A Degradation Prediction of Circuit Delay Using A Gradient Descent Method Seiichirou Mori, Masayuki Gondou, Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech)  DC2020-59 |
As the risk of aging-induced faults of VLSIs is increasing, highly reliable systems require to predict when the aging-in... [more] | DC2020-59 pp.1-6 |
| DC | 2019-12-20 16:30 |
Wakayama | Aging Observation using On-Chip Delay Measurement in Long-term Reliability Test Yousuke Miyake, Takaaki Kato, Seiji Kajihara (Kyutech), Masao Aso, Haruji Futami, Satoshi Matsunaga (Syswave), Yukiya Miura (TMU) DC2019-85 |
Avoidance of delay-related faults due to aging phenomena is an important issue of VLSI systems. Periodical delay measure... [more] | DC2019-85 pp.37-42 |
|
| R | 2019-11-28 16:25 |
Osaka | Central Electric Club | Reliability Methodologies for Degradation Predictions Based on Hierarchical Bayesian Modeling and Machine Learning Toru Kaise, Toyohiko Egami (Univ. of Hyogo) R2019-49 |
Degradation processes are significant for making values of reliability. Particularly, it is known that stochastic model... [more] |
R2019-49 pp.35-38 |
| CPM, ED, EID, SDM, ICD, MRIS, QIT, SCE, OME, EMD (Joint) [detail] |
2018-03-08 15:15 |
Shizuoka | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions 4 -- Keiji Koshida, Shin-ichi Wada (TMC), Koichiro Sawa (NIT) EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 |
Authors have studied degradation phenomena on electrical contacts under oscillations. In addition, they have developed a... [more] | EMD2017-75 MR2017-46 SCE2017-46 EID2017-48 ED2017-120 CPM2017-140 SDM2017-120 ICD2017-125 OME2017-69 pp.15-20 |
|
| EE | 2018-01-30 13:35 |
Oita | Satellite Campus Oita | Failure Prediction Using Low Stability Phenomenon of Digitally Controlled SMPS by Electrolytic Capacitor ESR Degradation Hiroshi Nakao, Yu Yonezawa, Yoshiyasu Nakashima (Fujitsu LAB), Fujio Kurokawa (NiAS) EE2017-71 |
Electrolytic capacitors are known as one of the highest failure rate components in switching mode power supply SMPS). We... [more] | EE2017-71 pp.165-170 |
| OME, SDM | 2017-04-21 14:05 |
Kagoshima | Tatsugochou Shougaigakushuu Center | Charge storage behavior of zirconia ceramics under DC electric field
-- Preparation of Y-TZP bioceramics with enhanced LTD durability -- Yumi Tanaka (Tokyo Univ. of Sci.), Hiroyuki Hara (Kyushu Univ.) SDM2017-8 OME2017-8 |
Yttria-stabilized tetragonal zirconia polycrystal (Y-TZP) is an important load-bearing bioceramic. However, a phenomenon... [more] | SDM2017-8 OME2017-8 pp.35-39 |
| EMD | 2015-10-02 16:50 |
Saitama | Fuji Electric FA Components & SystemCo.,Ltd. | Degradation Phenomenon of Electrical Contacts by using a Micro-Sliding Mechanism
-- The comparison with input waveforms concerning of minimal sliding amplitudes under some conditions -- Shin-ichi Wada, Keiji Koshida (TMC), Koichiro Sawa (NIT) EMD2015-66 |
Authors have studied the degradation phenomenon on contact resistance under the influences of an external micro-oscillat... [more] | EMD2015-66 pp.37-42 |
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