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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| R | 2023-12-07 15:40 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
Dependability/Risk-related Measures for Safety-related Systems conforming to Functional Safety
-- Formulation of MTTFF, Dangerous Failure Rate λ and Restoration Rate μ -- Ko Kawashima (ORIENTAL MOTOR), Yoshinobu Sato (Institute of Healthcare Quality ImprovementInstitute of Healthca)  R2023-53 |
When the overall system does not comply with the independence requirements between the demand and the reliability charac... [more] | R2023-53 pp.18-23 |
| MSS, CAS, SIP, VLD | 2023-07-06 11:00 |
Hokkaido | (Primary: On-site, Secondary: Online) |
Lifetime improvement of Memristor-based Hyperdimensional Computing Inference Accelerator by Error Detection and Built-in Self Repair Tetsuro Iwasaki, Michihiro Shintani (KIT) CAS2023-5 VLD2023-5 SIP2023-21 MSS2023-5 |
The implementation of hyperdimensional computing in memristors is expected to realize a highly efficient inferencer for ... [more] | CAS2023-5 VLD2023-5 SIP2023-21 MSS2023-5 pp.22-27 |
| R | 2022-12-15 14:30 |
Online | Online | Metric for Dependability/Risk and Functional Safety Ko Kawashima (ORIENTAL MOTOR), Yoshinobu Sato (Institute of Healthcare Quality Improvement, Tokyo Healthcare Fo) R2022-44 |
The risk due to malfunctioning of safety functions performed by electrical/electronic/programmable electronic safety-rel... [more] | R2022-44 pp.1-6 |
| R | 2022-12-15 15:45 |
Online | Online | The trends of IEC/TC 56 Dependability Ko Kawashima (ORIENTAL MOTOR), Yoshinobu Sato (Institute for Healthcare Quality Improvement), Yoshiki Kinoshita (Kanagawa Univ.), Hiroyuki Goto (D.SS), Akihiko Masuda (Reliability Seven Tools (R7) Practice Studio), Shigeru Yanagi (National Defense Academy), Makoto Takeyama (Kanagawa Univ.), Tadahiro Shibutani (Yokohama National Univ.) R2022-47 |
IEC/TC 56 is in charge of developing and revising international dependability standards related horizontally to both of ... [more] | R2022-47 pp.19-24 |
| EMD, R | 2020-02-14 13:35 |
Shizuoka | Trend on standardization of Dependability
-- Outline of IEC TC 56 2016 Sydney international meeting and drafts from Japan -- Hiroyuki Goto (FDK), Yoshinobu Sato (The IHQI, Tokyo Healthcare Foundation), Fumiaki Harada (D-Tech Partners), Yoshiki Kinoshita (Kanagawa University) R2019-54 EMD2019-54 |
IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Shanghai, China... [more] | R2019-54 EMD2019-54 pp.1-6 |
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| KBSE | 2018-03-01 16:30 |
Okinawa | Trial and Evaluation of D-Case Workshop Yuto Onuma, Yutaka Matsuno (NU) KBSE2017-61 |
In recent years, cases have been occurring which impair the reliability of Japanese industries such as camouflage of ins... [more] | KBSE2017-61 pp.133-137 |
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| KBSE | 2018-01-25 16:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Proposal on Model Based Dependability using ArchiMate Shuichiro Yamamoto (Nagoya Univ.) KBSE2017-35 |
Traditional assurance approaches independently develop assurance cases for architecture diagrams. This paper proposes a ... [more] | KBSE2017-35 pp.19-24 |
| R | 2017-12-15 15:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | An overview of IEC 62856 Open systems dependability
-- Consensus Building, Accountability Achievement, Failure Response and Change Accommodation -- Yoshiki Kinoshita, Makoto Takeyama (KU) R2017-59 |
IEC 62853 Open systems dependability, which is being developed by IEC TC56 at the stage of AFDIS (Approved for Final Dra... [more] | R2017-59 pp.19-23 |
| R | 2017-12-15 15:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | R2017-60 |
Plenary meeting of IEC TC 56 “Dependability” was held in Tokyo this year. Firstly, Mr. Mori (METI) welcomed the TC 56 an... [more] | R2017-60 pp.25-30 |
| KBSE | 2017-01-24 11:30 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | Trend and Issues on Assured Architecture Development Method for O-DA Shuichiro Yamamoto (Nagoya Univ.) KBSE2016-36 |
The O-DA (Open Dependability through Assuredness) is a The Open Group standard proposed by authors. O-DA standardizes ba... [more] | KBSE2016-36 pp.31-36 |
| R | 2016-12-16 14:15 |
Kanagawa | Maholoba Minds Miura (Miura City, Kanagawa Prefecture) | Trend on standardization of dependability
-- Outline of IEC TC56 2016 Sydney international meeting and drafts from Japan -- Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita (KU) R2016-54 |
IEC/TC 56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Sydney, Austral... [more] | R2016-54 pp.1-6 |
| R | 2016-10-21 13:55 |
Okinawa | Okinawaken Seinenkaikan | History and positioning of service reliability terms up to the JIS Z 8115 draft amendment Akihiko Masuda (R7 Practical Studio) R2016-43 |
Service-related quality and reliability terms, as a rule, are not included in the current JIS Z 8115:2000 Dependability ... [more] | R2016-43 pp.7-12 |
| VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2015-12-01 15:45 |
Nagasaki | Nagasaki Kinro Fukushi Kaikan | [Fellow Memorial Lecture]
Improving System Dependability by VLSI Test Technology Seiji Kajihara (KIT) VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51 |
VLSI Test technology for detection of manufacturing faults has been developed to improve test quality that is the capabi... [more] | VLD2015-44 CPM2015-128 ICD2015-53 CPSY2015-64 DC2015-40 RECONF2015-51 pp.43-44(VLD), pp.9-10(CPM), pp.9-10(ICD), pp.19-20(CPSY), pp.43-44(DC), pp.19-20(RECONF) |
| R | 2015-07-31 16:35 |
Aomori | Latest trends of JIS reliability design and analysis terminology
-- Comparison with JIS Z 8115 amendment drafts and IEC 60050-192 first edition -- Akihiko Masuda (R7 Studio), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor), Fumiaki Harada (FXAT) R2015-21 |
Dependability (reliability) terms of IEC 60050-192 standard was enacted in February 2015. It has passed 25 years since t... [more] | R2015-21 pp.43-48 |
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| DC, CPSY | 2015-04-17 13:25 |
Tokyo | A study of processor architecture suited for intelligent sensing system Hiroki Hihara, Akira Iwasaki (Univ. of Tokyo), Masanori Hashimoto (Osaka Univ./JST CREST), Hiroyuki Ochi (Rits/JST CREST), Yukio Mitsuyama (KUT/JST CREST), Hidetoshi Onodera (Kyoto Univ./JST CREST), Hiroyuki Kanbara (ASTEM/JST CREST), Kazutoshi Wakabayashi, Takashi Takenaka, Takashi Takenaka, Hiromitsu Hada, Munehiro Tada (NEC/JST CREST) CPSY2015-8 DC2015-8 |
Sensor nodes are now important elements for the system of social infrastructure, and thus intelligent processing capabil... [more] | CPSY2015-8 DC2015-8 pp.43-48 |
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| R | 2014-12-19 15:00 |
Tokyo | Aims and Key Issues of the Revision of JIS Z 8115 Dependability (Reliability) Terms -Part 2- Ko Kawashima (ORIENTAL MOTOR), Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV GL Business Assurance Japan), Hiroyuki Goto (FDK) R2014-69 |
The revision of JIS Z 8115:2000 Glossary of Used in Dependability is proceeded. In this revision, some terms and defini... [more] |
R2014-69 pp.25-28 |
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| R | 2014-12-19 15:25 |
Tokyo | Trend on standardization of dependability
-- Outline of IEC TC56 and agenda on international meeting -- Hiroyuki Goto (FDK), Yoshinobu Sato (JACO), Yoshiki Kinoshita, Makoto Takeyama (KU) R2014-70 |
IEC/TC56 (International Electrotechnical Commission/Technical Committee 56) plenary meeting was held in Prague, Czech Re... [more] | R2014-70 pp.29-34 |
|
| KBSE | 2014-11-06 14:45 |
Kyoto | Doshisha Univ.(Kanbai-kan 3F, Muromachi Campus, Kyoto) | A Comparative capability analysis on the context description methods for CDM Masanori Matsumura, Shuji Morisaki, Noritoshi Atsumi, Shuichiro Yamamoto (Nagoya Univ.) KBSE2014-30 |
In case of describing D-Case diagrams based on CDM(Context Dependency Matrix), the system components as well as conditio... [more] | KBSE2014-30 pp.13-18 |
| R | 2014-08-01 15:45 |
Hokkaido | Smile Hotel Hakodate | Aims and Key Issues of the Amendment of JIS Z 8115 Dependability (Reliability) Terms (Part 1) Akihiko Masuda (Tokyo Univ. of Science), Tateki Nishi (DNV), Hiroyuki Goto (FDK), Ko Kawashima (Oriental Motor) R2014-19 |
Since JIS Z 8115 standard of reliability term was revised in 2000, 14 years have passed. There was the existence of the ... [more] | R2014-19 pp.31-36 |
| KBSE | 2014-03-06 15:35 |
Okinawa | Okinawaken-Seinenkaikan | A consideration on method to assure business process with D-Case Kenta Murai, Shuichiro Yamamoto (Nagoya Univ.) KBSE2013-86 |
Business Process Modeling Notation (BPMN) is proposed as a notation to make it easy to understand and improve business p... [more] | KBSE2013-86 pp.43-48 |
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