|
|
All Technical Committee Conferences (Searched in: Recent 10 Years)
|
|
Search Results: Conference Papers |
Conference Papers (Available on Advance Programs) (Sort by: Date Descending) |
|
Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
LQE, CPM, ED |
2020-11-27 15:20 |
Online |
Online |
MOVPE Growth on Low-dislocation-density AlN Templates with Nano-Striped Patterns and Crystalline-Quality Evaluations Yukino Iba, Kanako Shojiki, Shigeyuki Kuboya, Kenjiro Uesugi, Shiyu Xiao, Hideto Miyake (Mie Univ.) ED2020-24 CPM2020-45 LQE2020-75 |
We conducted metalorganic vapor phase epitaxial (MOVPE) growth of AlN films on face-to-face annealed sputtered AlN templ... [more] |
ED2020-24 CPM2020-45 LQE2020-75 pp.91-94 |
LQE |
2017-12-15 14:10 |
Tokyo |
|
[Invited Talk]
Recent progress of AlGaN deep-UV LEDs Hideki Hirayama, Masafumi Jo, Noritoshi Maeda (RIKEN), Yukio Kashima (Marubun) LQE2017-91 |
AlGaN deep ultraviolet light-emitting diodes (DUV-LEDs) are attracting a great deal of attention, since they have the po... [more] |
LQE2017-91 pp.21-26 |
CPM, LQE, ED |
2016-12-12 13:00 |
Kyoto |
Kyoto University |
Current-voltage characteristics of Ni/Au Schottky diodes fabricated on InAlN/AlN/GaN heterostructures grown on GaN substrates Junji Kotani, Atsushi Yamada, Tetsuro Ishiguro, Norikazu Nakamura (Fujitsu Lab.) ED2016-57 CPM2016-90 LQE2016-73 |
This paper investigate the effects of threading dislocation density on the leakage characteristics of Ni/Au Schottky dio... [more] |
ED2016-57 CPM2016-90 LQE2016-73 pp.1-4 |
|
|
|
Copyright and reproduction :
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
|
[Return to Top Page]
[Return to IEICE Web Page]
|