Committee |
Date Time |
Place |
Paper Title / Authors |
Abstract |
Paper # |
DC |
2019-02-27 09:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73 |
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] |
DC2018-73 pp.13-18 |
DC |
2014-02-10 10:55 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A Low Power Dissipation Oriented Don't Care Filling Method Using SAT Yoshiyasu Takahashi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ) DC2013-83 |
High power dissipation can occur by high launch-induced switching activity when the response to a test pattern is captur... [more] |
DC2013-83 pp.25-30 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2012-11-28 16:25 |
Fukuoka |
Centennial Hall Kyushu University School of Medicine |
A Study on Test Generation for Effective Test Compaction Yukino Kusuyama, Tatuya Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) VLD2012-105 DC2012-71 |
In recent year, the numbers of target fault models and faults for testing increase because the number of gates on VLSIs ... [more] |
VLD2012-105 DC2012-71 pp.267-272 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2011-11-29 09:50 |
Miyazaki |
NewWelCity Miyazaki |
A Scan Chain Construction Method to Reduce Test Data Volume on BAST Yun Chen, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) VLD2011-73 DC2011-49 |
BAST is one of techniques which are combined ATPG and BIST to reduce the amount of test data while maintaining the high ... [more] |
VLD2011-73 DC2011-49 pp.127-132 |
DC |
2011-06-24 15:50 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A don't care identification method with care bit distribution control
-- Application to capture power reduction -- Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ) DC2011-12 |
The growing density and complexity for VLSIs recently cause an increase in the numbers of test patterns and fault models... [more] |
DC2011-12 pp.23-28 |
DC |
2010-06-25 15:15 |
Tokyo |
Kikai-Shinko-Kaikan Bldg. |
A test pattern matching method on BAST architecture using don't care identification for the detection of random pattern resistant faults Yun Chen, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) DC2010-11 |
BAST is one of techniques which are combined ATPG and BIST to reduce the amount of test data while maintaining the high ... [more] |
DC2010-11 pp.19-24 |
DC |
2009-02-16 15:20 |
Tokyo |
|
A Method to Increase the Number of Don't care based on Easy- To-Detected Faults
-- Application for BAST Architecture -- LingLing Wan (Graduate Schoo of Nihon Univ.), Motohiro Wakazono (Graduate School of Nihon Univ.), Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) DC2008-76 |
The BIST Aided Scan Test (BAST) is a technique that combines the
automatic test pattern generator (ATPG) and the Built-... [more] |
DC2008-76 pp.49-54 |
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM (Joint) [detail] |
2008-11-17 13:00 |
Fukuoka |
Kitakyushu Science and Research Park |
On Improving Transition Fault Coverage of Stuck-at Fault Tests Using Don't Care Identification Technique Kazumitsu Hamasaki, Toshinori Hosokawa (Nihon Univ.) VLD2008-60 DC2008-28 |
In recent year, transition fault testing and/or bridging fault testing for VLSIs are increasingly required in addition t... [more] |
VLD2008-60 DC2008-28 pp.1-6 |