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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 8 of 8  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
DC 2019-02-27
09:50
Tokyo Kikai-Shinko-Kaikan Bldg. A Low Capture Power Oriented X-Identification Method Mimicking Fault Propagation Paths of Capture Safe Test Vectors
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ) DC2018-73
Low power oriented don't care (X) identification and X filling methods have been proposed to reduce the numbers of captu... [more] DC2018-73
pp.13-18
DC 2014-02-10
10:55
Tokyo Kikai-Shinko-Kaikan Bldg. A Low Power Dissipation Oriented Don't Care Filling Method Using SAT
Yoshiyasu Takahashi, Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ) DC2013-83
High power dissipation can occur by high launch-induced switching activity when the response to a test pattern is captur... [more] DC2013-83
pp.25-30
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2012-11-28
16:25
Fukuoka Centennial Hall Kyushu University School of Medicine A Study on Test Generation for Effective Test Compaction
Yukino Kusuyama, Tatuya Yamazaki, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyusyu Univ.), Koji Yamazaki (Meiji Univ.) VLD2012-105 DC2012-71
In recent year, the numbers of target fault models and faults for testing increase because the number of gates on VLSIs ... [more] VLD2012-105 DC2012-71
pp.267-272
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2011-11-29
09:50
Miyazaki NewWelCity Miyazaki A Scan Chain Construction Method to Reduce Test Data Volume on BAST
Yun Chen, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) VLD2011-73 DC2011-49
BAST is one of techniques which are combined ATPG and BIST to reduce the amount of test data while maintaining the high ... [more] VLD2011-73 DC2011-49
pp.127-132
DC 2011-06-24
15:50
Tokyo Kikai-Shinko-Kaikan Bldg. A don't care identification method with care bit distribution control -- Application to capture power reduction --
Hiroshi Yamazaki, Toshinori Hosokawa (Nihon Univ), Masayoshi Yoshimura (Kyushu Univ) DC2011-12
The growing density and complexity for VLSIs recently cause an increase in the numbers of test patterns and fault models... [more] DC2011-12
pp.23-28
DC 2010-06-25
15:15
Tokyo Kikai-Shinko-Kaikan Bldg. A test pattern matching method on BAST architecture using don't care identification for the detection of random pattern resistant faults
Yun Chen, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) DC2010-11
BAST is one of techniques which are combined ATPG and BIST to reduce the amount of test data while maintaining the high ... [more] DC2010-11
pp.19-24
DC 2009-02-16
15:20
Tokyo   A Method to Increase the Number of Don't care based on Easy- To-Detected Faults -- Application for BAST Architecture --
LingLing Wan (Graduate Schoo of Nihon Univ.), Motohiro Wakazono (Graduate School of Nihon Univ.), Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyushu Univ.) DC2008-76
The BIST Aided Scan Test (BAST) is a technique that combines the
automatic test pattern generator (ATPG) and the Built-... [more]
DC2008-76
pp.49-54
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]
2008-11-17
13:00
Fukuoka Kitakyushu Science and Research Park On Improving Transition Fault Coverage of Stuck-at Fault Tests Using Don't Care Identification Technique
Kazumitsu Hamasaki, Toshinori Hosokawa (Nihon Univ.) VLD2008-60 DC2008-28
In recent year, transition fault testing and/or bridging fault testing for VLSIs are increasingly required in addition t... [more] VLD2008-60 DC2008-28
pp.1-6
 Results 1 - 8 of 8  /   
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