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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| HWS | 2024-04-19 15:25 |
Tokyo | (Tokyo, Online) (Primary: On-site, Secondary: Online) |
Applying Ring Oscillator-based Laser Detection Sensor to AES Circuitry on FPGA Shungo Hayashi, Junichi Sakamoto, Tsutomu Matsumoto (AIST/YNU)  HWS2024-3 |
(To be available after the conference date) [more] | HWS2024-3 pp.8-13 |
| NS, IN (Joint) |
2024-03-01 11:35 |
Okinawa | Okinawa Convention Center (Okinawa) | Evaluation for effectiveness of time precision in a packet monitoring system Daichi Muramatsu, Ayaka Doi, Daigo Deguchi (Daido Univ), Takashi Kurimoto (NII), Hiroyuki Kimiyama (Daido Univ) NS2023-213 |
A network monitoring system, which is integrated with a general PC, is widely used for network operation and many kind o... [more] | NS2023-213 pp.240-245 |
| VLD, HWS, ICD | 2024-03-01 11:40 |
Okinawa | (Okinawa, Online) (Primary: On-site, Secondary: Online) |
Improved Ring Oscillator Sensor for Laser Fault Injection Detection on FPGA Masaki Chikano (YNU), Shungo Hayashi, Junichi Sakamoto (YNU/AIST), Tsutomu Matsumoto (YNU) VLD2023-125 HWS2023-85 ICD2023-114 |
A fault attack is an attack that intentionally injects a fault into an operating device in order to leak internal confid... [more] | VLD2023-125 HWS2023-85 ICD2023-114 pp.135-140 |
| HWS, VLD | 2023-03-01 11:00 |
Okinawa | (Okinawa, Online) (Primary: On-site, Secondary: Online) |
Measured Evaluation of BTI Degradation in a 65nm FDSOI Process using Ring Oscillators with Same Circuit Structure Daisuke Kikuta (KIT), Ryo Kishida (TPU), Kazutoshi Kobayashi (KIT) VLD2022-73 HWS2022-44 |
(To be available after the conference date) [more] | VLD2022-73 HWS2022-44 pp.1-6 |
| HWS, VLD | 2023-03-04 10:00 |
Okinawa | (Okinawa, Online) (Primary: On-site, Secondary: Online) |
Importance of Inverters Placement in Ring-Oscilator for Laser Irradiation Detection Shungo Hayashi (YNU), Junichi Sakamoto (AIST/YNU), Masaki Chikano, Tsutomu Matsumoto (YNU) VLD2022-115 HWS2022-86 |
Laser fault injection is known as the most efficient fault injection technique due to its high spatial controllability a... [more] | VLD2022-115 HWS2022-86 pp.233-238 |
| CAS, CS | 2023-03-01 15:15 |
Fukuoka | Kitakyushu International Conference Center (Fukuoka, Online) (Primary: On-site, Secondary: Online) |
A Study of Simultaneous Firing Phenomena by Applying Common Noise in Integrate-and-Fire Oscillation Circuits with Mismatched Circuit Parameters Shota Nakayama, Akio Takada (NIT, Hakodate College), Tadashi Tsubone (Nagaoka Univ of Technology) CAS2022-106 CS2022-83 |
The phenomenon of uncoupled oscillators synchronizing by applying common noise is known as noise-induced synchronization... [more] | CAS2022-106 CS2022-83 pp.59-64 |
| CAS, NLP | 2022-10-21 14:30 |
Niigata | (Niigata, Online) (Primary: On-site, Secondary: Online) |
Synchronization Phenomena in Integrate-and-fire Oscillator Circuits having Dead Zones Induced by Pulses with Irregular Intervals Shota Nakayama, Akio Takada (N.I.T., Hakodate College), Tadashi Tubone (NUT) CAS2022-32 NLP2022-52 |
The phenomena that independent oscillators synchronize by applying common noise are known as noise-induced synchronizati... [more] | CAS2022-32 NLP2022-52 pp.65-70 |
| DC | 2022-03-01 10:55 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Tokyo, Online) (Primary: On-site, Secondary: Online) |
On Correction for Temperature and Voltage Effects in On-Chip Delay Measurement Takaaki Kato (KIT), Yousuke Miyake (PRIVATECH), Seiji Kajihara (KIT) DC2021-67 |
It is effective for aging of a logic circuit to measure a circuit delay periodically in field. In order to compare the d... [more] | DC2021-67 pp.18-23 |
| HWS | 2021-04-12 15:05 |
Tokyo | Tokyo University/Online (Tokyo, Online) (Primary: On-site, Secondary: Online) |
Fundamental Study on Evaluating Frequency Injection Attack Resistance against RO-based TRNGs Riki Hashimoto, Daisuke Fujimoto, Yuichi Hayashi (NAIST) HWS2021-9 |
Frequency injection attacks have been reported as an attack to degrade the randomness of ring oscillator (RO)-based true... [more] | HWS2021-9 pp.39-42 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2021-03-26 10:40 |
Online | Online (Online) | Unsupervised Recycled FPGA Detection Using Direct Density Ratio Estimation Based on Self-referencing Yuya Isaka (KGU), Michihiro Shintani (NAIST), Foisal Ahmed (PU), Michiko Inoue (NAIST) CPSY2020-60 DC2020-90 |
It is well known that the performance of field-programmable gate-array (FPGA) degrades over time due to their usage. Sev... [more] | CPSY2020-60 DC2020-90 pp.61-66 |
| HWS, VLD [detail] | 2021-03-03 14:30 |
Online | Online (Online) | Measurement of Voltage-variation-tolerant Temperature Sensor for Standard CMOS Chip with On-chip Solar Cell Shuto Murohara, Tatsuya Banno, Tomoya Kimura, Takashi Imagawa, Hiroyuki Ochi (Ritsumeikan Univ.) VLD2020-74 HWS2020-49 |
Aiming at realizing a CMOS-process-compatible external-component-free SoC with an on-chip solar cell and a temperature s... [more] | VLD2020-74 HWS2020-49 pp.32-37 |
| DC | 2021-02-05 10:30 |
Online | Online (Online) | A Study on a Method of Measuring Process Variations Considering the Effect of Wire Delay on FPGA Shingo Tsutsumi, Yukiya Miura (Tokyo Metropolitan Univ.) DC2020-69 |
FPGAs are integrated circuits that can be implemented arbitrary logic functions. In FPGAs, it is important to measure pr... [more] | DC2020-69 pp.1-6 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM (Joint) [detail] |
2020-11-18 14:00 |
Online | Online (Online) | Measurement Results of Total Ionizing Dose Effect on Ring Oscillators Fabricated by a Thin-BOX FDSOI Process for Outer-space Mission Takashi Yoshida, Jun Furuta, Kazutoshi Kobayashi (KIT) VLD2020-30 ICD2020-50 DC2020-50 RECONF2020-49 |
The Total Ionizing Dose (TID) effect is one of the major concerns for semiconductor devices in outer space, where high a... [more] | VLD2020-30 ICD2020-50 DC2020-50 RECONF2020-49 pp.110-114 |
| HWS, VLD [detail] | 2020-03-07 10:30 |
Okinawa | Okinawa Ken Seinen Kaikan (Okinawa) (Cancelled but technical report was issued) |
Causes of Entropy Loss on Non-IID PUFs and their Entropy Estimations (1) Mitsuru Shiozaki (Ritsumeikan Univ.), Yohei Hori (AIST), Shunsuke Okura, Masayoshi Shirahata, Takeshi Fujino (Ritsumeikan Univ.) VLD2019-138 HWS2019-111 |
Recently, evaluation items and evaluation schemes of Physically Unclonable Functions (PUFs) are discussed in internation... [more] | VLD2019-138 HWS2019-111 pp.257-262 |
| DC | 2020-02-26 10:00 |
Tokyo | (Tokyo) | On Machine Learning Based Accuracy Improvement for A Digital Temperature and Voltage Sensor Masayuki Gondo, Yousuke Miyake, Seiji Kajihara (Kyutech) DC2019-86 |
To measure an on-chip temperature and voltage during VLSI operation, an RO(Ring Oscillator)-based digital temperature an... [more] | DC2019-86 pp.1-6 |
| DC | 2020-02-26 15:45 |
Tokyo | (Tokyo) | Frequency Variation of Ring Oscillators During Long-Time Operation on FPGA Shingo Tsutsumi, Yukiya Miura (Tokyo Metropolitan Univ.) DC2019-95 |
FPGAs (Field Programmable Gate Arrays) are integrated circuits that can be implemented arbitrary logic functions by reco... [more] | DC2019-95 pp.55-60 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-15 09:15 |
Ehime | Ehime Prefecture Gender Equality Center (Ehime) | A Study on Dependence between Performance Metrics of PUFs and the Number of Response Bits using PUF Numerical Model Tatsuya Oyama, Masayoshi Shirahata, Mitsuru Shiozaki, Shunsuke Okura (Ritsumeikan Univ.), Yohei Hori (AIST), Takeshi Fujino (Ritsumeikan Univ.) ICD2019-33 IE2019-39 |
Recently, performance metrics of Physically Unclonable Function (PUF) are discussed toward international standardization... [more] | ICD2019-33 IE2019-39 pp.25-30 |
| VLD, DC, CPSY, RECONF, ICD, IE, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC (Joint) [detail] |
2019-11-15 14:15 |
Ehime | Ehime Prefecture Gender Equality Center (Ehime) | Triple-Layered Ring Oscillators and Image Sensors Developed by Direct Bonding of SOI Wafers Masahide Goto (NHK), Yuki Honda (NHK-ES), Toshihisa Watabe, Kei Hagiwara, Masakazu Nanba, Yoshinori Iguchi (NHK), Takuya Saraya, Masaharu Kobayashi (Univ. of Tokyo), Eiji Higurashi (AIST), Hiroshi Toshiyoshi, Toshiro Hiramoto (Univ. of Tokyo) ICD2019-38 IE2019-44 |
We have studied on pixel-parallel three-dimensional (3D) integrated CMOS image sensors. We previously reported double-la... [more] | ICD2019-38 IE2019-44 pp.45-49 |
| ISEC, SITE, ICSS, EMM, HWS, BioX, IPSJ-CSEC, IPSJ-SPT [detail] | 2019-07-24 09:30 |
Kochi | Kochi University of Technology (Kochi) | Electromagnetic Analysis Attacks on an ASIC Implementation of a Ring-Oscillator PUF Mitsuru Shiozaki, Takeshi Fujino (Ritsumeikan Univ.) ISEC2019-39 SITE2019-33 BioX2019-31 HWS2019-34 ICSS2019-37 EMM2019-42 |
Physically unclonable functions (PUFs) are assumed to provide high tamper resistance against counterfeits and hardware a... [more] | ISEC2019-39 SITE2019-33 BioX2019-31 HWS2019-34 ICSS2019-37 EMM2019-42 pp.227-234 |
| HWS | 2019-04-12 15:05 |
Miyagi | Tohoku University (Miyagi) | Implementation and Experimental Evaluation of Physically Unclonable Functions in 180nm CMOS Process Mitsuru Shiozaki, Takaya Kubota, Masayoshi Shirahata (Ritsumeikan Univ.), Yohei Hori, Toshihiro Katashita (AIST), Takeshi Fujino (Ritsumeikan Univ.) HWS2019-4 |
Evaluation items and evaluation schemes of Physically Unclonable Function (PUF) are discussed in international standardi... [more] | HWS2019-4 pp.19-24 |
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