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Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2012-11-26
16:00		 Fukuoka Centennial Hall Kyushu University School of Medicine Secure Scan Architecture Using State Dependent Scan Flip Flop with Key-Based Configuration against Scan-Based Attack
Yuta Atobe, Youhua Shi, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2012-67 DC2012-33		 Secure cryptographic LSIs is intensively used in order to perform confidential operation. Scan test has become the most ... [more] VLD2012-67 DC2012-33
pp.45-50
IE, SIP, ICD, VLD, IPSJ-SLDM [detail] 2012-10-19
16:00		 Iwate Hotel Ruiz Secure Scan Architecture Using State Dependent Scan Flip-Flop with Key-Based Configuration on RSA Circuit  
Yuta Atobe, Youhua Shi, Masao Yanagisawa, Nozomu Togawa (Waseda Univ.) VLD2012-57 SIP2012-79 ICD2012-74 IE2012-81		 Scan test is one of the useful design for testability techniques, which can detect circuit failure efficiently. However,... [more] VLD2012-57 SIP2012-79 ICD2012-74 IE2012-81
pp.95-100
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2011-11-29
10:15		 Miyazaki NewWelCity Miyazaki A BIST-Aided Scan Test using Shifting Inverter Code and a TPG Method for Test Data Reduction
Yasuhiko Okada, Hiroyuki Yotsuyanagi, Masaki Hashizume (Univ. of Tokushima) VLD2011-74 DC2011-50		 BIST-aided scan test (BAST) has been proposed as one of the techniques that enhance scan-based BIST.The BAST architectur... [more] VLD2011-74 DC2011-50
pp.133-138
VLD, DC, IPSJ-SLDM, CPSY, RECONF, ICD, CPM
(Joint) [detail]		 2009-12-03
11:00		 Kochi Kochi City Culture-Plaza A Quantitative Evaluation of Security for Scan-based Side Channel Attack and Countermeasures
Yuma Ito, Masayoshi Yoshimura, Hiroto Yasuura (Kyushu Univ) VLD2009-52 DC2009-39		 There is a potential that the secret information on an encryption LSI is leaked from a scan chain. There are many counte... [more] VLD2009-52 DC2009-39
pp.73-78
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