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All Technical Committee Conferences (Searched in: All Years)
| Committee | Date Time | Place | Paper Title / Authors | Abstract | Paper # | |
| KBSE | 2024-03-14 09:55 |
Okinawa | Okinawa Prefectual General Welfare Center (Primary: On-site, Secondary: Online) |
Development of a Support System for Unit Testing Kana Suetake, Takafumi Tanaka (Tamagawa Univ.)  KBSE2023-66 |
To develop high-quality software, it is essential that developers possess comprehensive software testing skills. Althoug... [more] | KBSE2023-66 pp.7-12 |
| DC | 2024-02-28 13:15 |
Tokyo | Kikai-Shinko-Kaikan Bldg. | A Study on Test Generation for Alleviating Over-testing of Approximate Multipliers Qilin Wang, Hideyuki Ichihara, Tomoo Inoue (Hiroshima City Univ.) DC2023-97 |
In this study, we discuss the alleviation of over-testing for approximate circuits. We target a design of approximate mu... [more] | DC2023-97 pp.17-22 |
| US | 2024-02-27 15:25 |
Tokyo | Tokyo Metropolitan Industrial Technology Research Institute (TIRI) | Generation of photoacoustic Chirp signal by gate-controlled laser irradiation and its performance validation Kazuyuki Nakahata, Kenta Yamauchi (Ehime Univ.), Takahiro Hayashi (Osaka Univ.) US2023-78 |
Ultrasonic waves generated in a solid by the photoacoustic effect of laser irradiation have a wide frequency range. Ther... [more] | US2023-78 pp.26-28 |
| SAT, SANE (Joint) |
2024-02-09 09:30 |
Kagoshima | AmaHome PLAZA (Amami City Shimin Koryu Center) (Primary: On-site, Secondary: Online) |
Development of Pseudo-Satellite Station for Ground Testing of ETS-9 Byeongpyo Jeong, Makio Tsuchiya, Nobuhito Taniuchi, Takashi Takahashi, Amane Miura, Hiroyuki Tsuji (NICT) SAT2023-68 |
NICT is conducting R & D on next-generation broadband satellite communications technology. By establishing control techn... [more] | SAT2023-68 pp.51-54 |
| DC | 2023-12-08 13:50 |
Nagasaki | ARKAS SASEBO (Primary: On-site, Secondary: Online) |
A Multiple Target Seed Generation Method for Random Pattern Resistant Faults Using a Compatible Fault Set on Built-in Self Test Takanobu Sone, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) DC2023-88 |
In recent years, with high density of very large-scale integrated circuits, it has become impractical to store a large n... [more] | DC2023-88 pp.7-12 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2023-11-16 16:20 |
Kumamoto | Civic Auditorium Sears Home Yume Hall (Primary: On-site, Secondary: Online) |
On Reducing Area Overhead of BIST for Approximate Multiplier Considering Truncated Bits Daichi Akamatsu, Shougo Tokai, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ.) VLD2023-60 ICD2023-68 DC2023-67 RECONF2023-63 |
Recently, approximate computing has attracted attention as a method to reduce power and area for error-tolerant applicat... [more] | VLD2023-60 ICD2023-68 DC2023-67 RECONF2023-63 pp.156-161 |
| NS | 2023-04-14 11:15 |
Fukushima | Nihon University, Koriyama Campus + Online (Primary: On-site, Secondary: Online) |
Automatic Test Cases Generation Method by Structuring Specification Documents using Deep Learning Kiyoshi Ueda, Yuya Sato (Nihon Univ.) NS2023-8 |
In the development of large-scale communication software, problems such as high development costs and insufficient manpo... [more] | NS2023-8 pp.38-43 |
| KBSE | 2023-03-17 13:25 |
Hiroshima | JMS ASTERPLAZA (Primary: On-site, Secondary: Online) |
A Note on Optimal Testcase Generation in Boundary Value Analysis Xiujing Guo, Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.) KBSE2022-65 |
In software testing, a protective measure to prevent faults in the code is to ensure that the behavior on the boundary b... [more] | KBSE2022-65 pp.67-72 |
| IN, NS (Joint) |
2023-03-03 09:30 |
Okinawa | Okinawa Convention Centre + Online (Primary: On-site, Secondary: Online) |
A Method for Selecting Training Data using Doc2Vec for Automatic Test Cases Generation Yuto Fujita, Kiyoshi Ueda (Nihon Univ) NS2022-223 |
In software development, research has been conducted to automate the process of extracting test cases for comprehensive/... [more] | NS2022-223 pp.322-327 |
| DC | 2023-02-28 11:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Test Generation Method to Distinguish Multiple Fault Pairs for Improvement of Fault Diagnosis Resolution Yuya Chida, Toshinori Hosokawa (NIhon Univ.), Koji Yamazaki (Meiji Univ.) DC2022-83 |
(To be available after the conference date) [more] | DC2022-83 pp.6-11 |
| DC | 2023-02-28 13:25 |
Tokyo | Kikai-Shinko-Kaikan Bldg (Primary: On-site, Secondary: Online) |
A Clear and Understandable Notation for Expressing T-Way Test Sequence Generation Constraints Lele Jiang, Tatsuhiro Tsuchiya (Osaka Univ.) DC2022-85 |
This paper focuses on the problem of constraint representation for the generation of t-way test sequences. T-way seque... [more] |
DC2022-85 pp.16-20 |
| VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] | 2022-11-28 15:00 |
Kumamoto | (Primary: On-site, Secondary: Online) |
On reduction of test patterns for a Multiplier Using Approximate Computing Shogo Tokai, Daichi Akamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ) VLD2022-23 ICD2022-40 DC2022-39 RECONF2022-46 |
In recent years, approximate computing has been used in error-tolerant applications. Several approximation methods have ... [more] | VLD2022-23 ICD2022-40 DC2022-39 RECONF2022-46 pp.25-30 |
| SDM | 2022-10-19 11:10 |
Online | Online | Resistance Masurement Technology for Statistical Analysis of Thin Films Materials for Emerging Memory with High Accuracy and Wide Range Hidemi Mitsuda, Ryousuke Tenman, Takezou Mawaki, Rihito Kuroda (Tohoku Univ) SDM2022-55 |
We report on a resistance measurement circuit that enables accurate, wide-range, and statistical evaluation of various t... [more] | SDM2022-55 pp.5-8 |
| CPSY, DC, IPSJ-ARC [detail] | 2022-07-27 11:00 |
Yamaguchi | Kaikyo Messe Shimonoseki (Primary: On-site, Secondary: Online) |
A Block Partitioning Method to Accelerate Test Generation for Gate-Exhaustive Faults Momona Mizota, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.) CPSY2022-3 DC2022-3 |
In gate-exhaustive fault model which covers defects in cells, since the number of faults is proportion to that of gates,... [more] | CPSY2022-3 DC2022-3 pp.13-18 |
| NS, SR, RCS, SeMI, RCC (Joint) |
2022-07-15 10:40 |
Ishikawa | The Kanazawa Theatre + Online (Primary: On-site, Secondary: Online) |
A Method for Selecting Training Data using Topic Models and Doc2Vec for Automatic Test Cases Generation Yuto Fujita, Kiyoshi Ueda (Nihon Univ.) NS2022-52 |
In the development of large-scale communication software, due to the increase in development cost and shortage of manpow... [more] | NS2022-52 pp.121-126 |
| CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] | 2022-03-10 10:50 |
Online | Online | A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage Yuya Chida, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) CPSY2021-57 DC2021-91 |
As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been propose... [more] | CPSY2021-57 DC2021-91 pp.73-78 |
| DC | 2022-03-01 14:45 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
SAT-based LFSR Seed Generation for Delay Fault BIST Kotaro Iwamoto, Satoshi Ohtake (Oita Univ.) DC2021-74 |
So far, a one-pass LFSR seed generation method for delay fault BIST has been proposed. The method directly generates see... [more] | DC2021-74 pp.57-62 |
| IA | 2022-01-28 14:00 |
Tokyo | Kikai-Shinko-Kaikan Bldg. (Primary: On-site, Secondary: Online) |
LiON: A L3 Protocol Agnostic Experimental Network Construction Tool Considering Disaggregation of Network/Device Configurations Yuki Nagai, Hiroki Watanabe, Takao Kondo, Fumio Teraoka (Keio Univ.) IA2021-54 |
An experimental network environment is required to examin new network systems. This paper proposes an exper- imental ne... [more] |
IA2021-54 pp.5-12 |
| DC | 2021-12-10 13:00 |
Kagawa | (Primary: On-site, Secondary: Online) |
A Low Power Oriented Multiple Target Test Generation Method Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55 |
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture... [more] | DC2021-55 pp.1-6 |
| SS, DC | 2021-10-19 13:55 |
Online | Online | Predict failure of test case generation Ryo Soga, Hideyuki Kanuka (Hitachi, Ltd.) SS2021-14 DC2021-19 |
The automation tools for improving productivity of software development are abandoned at times due to lower-than-expecte... [more] | SS2021-14 DC2021-19 pp.7-12 |
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