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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 191  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
VLD, DC, RECONF, ICD, IPSJ-SLDM [detail] 2022-11-28
Ishikawa Kanazawa Bunka Hall
(Primary: On-site, Secondary: Online)
On reduction of test patterns for a Multiplier Using Approximate Computing
Shogo Tokai, Daichi Akamatsu, Hiroyuki Yotsuyanagi, Masaki Hashizume (Tokushima Univ) VLD2022-23 ICD2022-40 DC2022-39 RECONF2022-46
(To be available after the conference date) [more] VLD2022-23 ICD2022-40 DC2022-39 RECONF2022-46
SDM 2022-10-19
Online Online Resistance Masurement Technology for Statistical Analysis of Thin Films Materials for Emerging Memory with High Accuracy and Wide Range
Hidemi Mitsuda, Ryousuke Tenman, Takezou Mawaki, Rihito Kuroda (Tohoku Univ) SDM2022-55
We report on a resistance measurement circuit that enables accurate, wide-range, and statistical evaluation of various t... [more] SDM2022-55
CPSY, DC, IPSJ-ARC [detail] 2022-07-27
Yamaguchi Kaikyo Messe Shimonoseki
(Primary: On-site, Secondary: Online)
A Block Partitioning Method to Accelerate Test Generation for Gate-Exhaustive Faults
Momona Mizota, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.) CPSY2022-3 DC2022-3
In gate-exhaustive fault model which covers defects in cells, since the number of faults is proportion to that of gates,... [more] CPSY2022-3 DC2022-3
Ishikawa The Kanazawa Theatre + Online
(Primary: On-site, Secondary: Online)
A Method for Selecting Training Data using Topic Models and Doc2Vec for Automatic Test Cases Generation
Yuto Fujita, Kiyoshi Ueda (Nihon Univ.) NS2022-52
In the development of large-scale communication software, due to the increase in development cost and shortage of manpow... [more] NS2022-52
CPSY, DC, IPSJ-SLDM, IPSJ-EMB, IPSJ-ARC [detail] 2022-03-10
Online Online A Test Generatoin Method to Improve Diagonostic Resolution Based on Fault Sensitization Coverage
Yuya Chida, Toshinori Hosokawa (Nihon Univ.), Koji Yamazaki (Meiji Univ.) CPSY2021-57 DC2021-91
As one of test generation methods to achieve high defect coverage, n-detection test generation methods have been propose... [more] CPSY2021-57 DC2021-91
DC 2022-03-01
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
SAT-based LFSR Seed Generation for Delay Fault BIST
Kotaro Iwamoto, Satoshi Ohtake (Oita Univ.) DC2021-74
So far, a one-pass LFSR seed generation method for delay fault BIST has been proposed. The method directly generates see... [more] DC2021-74
IA 2022-01-28
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
LiON: A L3 Protocol Agnostic Experimental Network Construction Tool Considering Disaggregation of Network/Device Configurations
Yuki Nagai, Hiroki Watanabe, Takao Kondo, Fumio Teraoka (Keio Univ.) IA2021-54
An experimental network environment is required to examin new network systems. This paper proposes an exper-
imental ne... [more]
DC 2021-12-10
(Primary: On-site, Secondary: Online)
A Low Power Oriented Multiple Target Test Generation Method
Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture... [more] DC2021-55
SS, DC 2021-10-19
Online Online Predict failure of test case generation
Ryo Soga, Hideyuki Kanuka (Hitachi, Ltd.) SS2021-14 DC2021-19
The automation tools for improving productivity of software development are abandoned at times due to lower-than-expecte... [more] SS2021-14 DC2021-19
BioX, ISEC, SITE, ICSS, EMM, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2021-07-20
Online Online Implementation and Evaluation of a Ring Oscillator Type True Random Number Generator (2)
Ryuichi Minagawa, KevinHideaki Omae, Kotarou Hayashi, Naoya Torii (Soka Univ.) ISEC2021-27 SITE2021-21 BioX2021-28 HWS2021-27 ICSS2021-32 EMM2021-32
A true random number generator (TRNG) is suitable for securing key generation and nonce generation on IoT devices. The r... [more] ISEC2021-27 SITE2021-21 BioX2021-28 HWS2021-27 ICSS2021-32 EMM2021-32
US 2021-06-18
Online Online Construction of discrimination support system using GAN for non-destructive testing images by scanning elastic wave source technique
Kyosuke Shimizu, Ayumu Osumi, Youichi Ito (Nihon Univ.) US2021-11
We proposed Scanning Airborne Ultrasound Source Technique (SAUA). SAUS is a detecting method of thinning defects generat... [more] US2021-11
US 2021-05-17
Online Online Visualization of guided wave propagation using scanning nonlinear elastic wave source technique with airborne ultrasound phased array
Kyosuke Shimizu, Ayumu Osumi, Youichi Ito (Nihon Univ.) US2021-3
We aim to realize a scanning laser source technique (SLS) by using high-intensity airborne ultrasonic waves.
As one of ... [more]
ICM 2021-03-18
Online Online Proposal of Automatic Generation Method of API Adapter Test Code
Sho Kanemaru, Yukitsugu Sasaki, Kensuke Takahashi, Tsuyoshi Toyoshima (NTT) ICM2020-59
In B2B2X (Business to Business to X) business model, the importance of API orchestrator for constructing and operating s... [more] ICM2020-59
SS 2021-03-03
Online Online Analysis of the Impact of Automatically Generated Test Cases on the Results of Automatic Bug Repair
Yuga Matsuda, Kyosuke Yamate, Yasutaka Kamei, Naoyasu Ubayashi (Kyushu Univ.) SS2020-32
In order to reduce debugging costs in software development, there has been a lot of research on automatic program repair... [more] SS2020-32
HIP, VRSJ 2021-02-19
Online Online Development and application of a highly sensitive color vision system
Masatoshi Kitaguchi, Sayumi Tsuyuguchi, Miwa Hashizume, Ayuka Kato, Tomoyuki Naito, Hiromichi Sato (Osaka Univ.) HIP2020-91
Dystrophinopathy is a progressive intractable disease that is caused by an abnormality in the gene for the causative pro... [more] HIP2020-91
DC 2021-02-05
Online Online Multiple Target Test Generation Method using Test Scheduling Information of RTL Hardware Elements
Ryuki Asami, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyoto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2020-74
In recent years, since the test cost for large-scale integrated circuits has increased, design-for-testability methods f... [more] DC2020-74
DC 2021-02-05
Online Online A Don't Care Filling Method of Control Signals Based on Non-scan Field Testability at Register Transfer Level
Yuki Ikegaya, Yuta Ishiyama, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.) DC2020-77
A field testing that monitors the values of circuit outputs and internal signal lines during function mode is used as on... [more] DC2020-77
CPSY, RECONF, VLD, IPSJ-ARC, IPSJ-SLDM [detail] 2021-01-26
Online Online Performance Testing of VRP Optimization of C Compilers by Random Program Generation
Daiki Murakami, Nagisa Ishiura (Kwansei Gakuin Univ.) VLD2020-66 CPSY2020-49 RECONF2020-85
This paper proposes an automated method to test if C compilers properly perform VRP optimization. The VRP optimization i... [more] VLD2020-66 CPSY2020-49 RECONF2020-85
CPSY, DC, IPSJ-ARC [detail] 2020-07-31
Online Online A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns
Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] CPSY2020-12 DC2020-12
SITE, ISEC, HWS, EMM, BioX, IPSJ-CSEC, IPSJ-SPT, ICSS [detail] 2020-07-21
Online Online Performance Evaluation of True Random Number Generator Using Latches
Naoya Torii, Hideaki Kevin Omae (Soka Univ.) ISEC2020-24 SITE2020-21 BioX2020-27 HWS2020-17 ICSS2020-11 EMM2020-21
The use of a physical random number generator (TRNG) is suitable for secure key generation of IoT devices and secure non... [more] ISEC2020-24 SITE2020-21 BioX2020-27 HWS2020-17 ICSS2020-11 EMM2020-21
 Results 1 - 20 of 191  /  [Next]  
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