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 Conference Papers (Available on Advance Programs)  (Sort by: Date Descending)
 Results 1 - 20 of 143  /  [Next]  
Committee Date Time Place Paper Title / Authors Abstract Paper #
SANE 2022-11-10
14:50
Chiba Chiba Univ. (Nishi-Chiba Campus)
(Primary: On-site, Secondary: Online)
Flight verification of flight duration of fuel powered fixed wing small UAV as a video transmission relay station
Satoshi Hyokawa, Msaya Miura, Kei Yasukawa, Koki Hamajima, Takuma Shibata, Masazumi Ueba (Muroran IT) SANE2022-58
As the use of unmanned aerial vehicles (UAVs) is increasingly popular and advancing in various fields, the authors are w... [more] SANE2022-58
pp.44-48
NS, SR, RCS, SeMI, RCC
(Joint)
2022-07-15
10:40
Ishikawa The Kanazawa Theatre + Online
(Primary: On-site, Secondary: Online)
A Method for Selecting Training Data using Topic Models and Doc2Vec for Automatic Test Cases Generation
Yuto Fujita, Kiyoshi Ueda (Nihon Univ.) NS2022-52
In the development of large-scale communication software, due to the increase in development cost and shortage of manpow... [more] NS2022-52
pp.121-126
EMCJ 2022-04-15
13:30
Okinawa  
(Primary: On-site, Secondary: Online)
Impact of Different Powered ESD Methods on 100BASE-T1 Communication Quality Degradation
Toya Nakatani, Yusuke Yano, Jianqing Wang (NIT), Takeshi Ishida (NoiseKen) EMCJ2022-2
IEC (International Electrotechnical Commission) has been working on the standardization of immunity evaluation methods f... [more] EMCJ2022-2
pp.7-12
DC 2022-03-01
14:20
Tokyo Kikai-Shinko-Kaikan Bldg.
(Primary: On-site, Secondary: Online)
Evaluation of Efficiency for a Method to Locate High Power Consumption with Switching Provability
Ryu Hoshino, Taiki Utsunomiya, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2021-73
In recent years, as the high speed and miniaturization of LSIs have improved, it has become more difficult to test LSIs.... [more] DC2021-73
pp.51-56
DC 2021-12-10
13:00
Kagawa
(Primary: On-site, Secondary: Online)
A Low Power Oriented Multiple Target Test Generation Method
Rei Miura, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyou Univ.), Masayuki Arai (Nihon Univ.) DC2021-55
In recent years, since capture power consumption for VLSIs significantly increases in at-speed scan testing, low capture... [more] DC2021-55
pp.1-6
MSS, CAS, IPSJ-AL [detail] 2021-11-18
10:55
Online Online Shortest cycles on a WRSN model provided by a WSN routing
Yoshihiro Kaneko, Keisuke Murase (Gifu Univ.) CAS2021-41 MSS2021-21
For a wireless sensor network WSN and its related models, we have so far considered routings, sink trajectories and so o... [more] CAS2021-41 MSS2021-21
pp.24-27
BioX, ISEC, SITE, ICSS, EMM, HWS, IPSJ-CSEC, IPSJ-SPT [detail] 2021-07-20
16:20
Online Online Implementation and Evaluation of a Ring Oscillator Type True Random Number Generator (2)
Ryuichi Minagawa, KevinHideaki Omae, Kotarou Hayashi, Naoya Torii (Soka Univ.) ISEC2021-27 SITE2021-21 BioX2021-28 HWS2021-27 ICSS2021-32 EMM2021-32
A true random number generator (TRNG) is suitable for securing key generation and nonce generation on IoT devices. The r... [more] ISEC2021-27 SITE2021-21 BioX2021-28 HWS2021-27 ICSS2021-32 EMM2021-32
pp.104-109
EE, IEE-HCA 2021-05-27
09:00
Online Online A Power Semiconductor Device Characterization Technique with Deep Learning Image Processing
Kosuke Matsumoto, Yoichi Isizuka (Nagasaki Univ.), Noritaka Shigei (Kagoshima Univ.), Takahiro Koga (ANSYS) EE2021-1
With the diversification of development themes in the power electronics field, rework in the manufacturing process has b... [more] EE2021-1
pp.1-6
WPT 2021-03-05
13:30
Online Online [Invited Lecture] Dynamic Wireless Power Transfer via Electric and Magnetic Hybrid Fields Achieving Reception of Reflected Waves
Aoi Oyane, Daiki Kuramoto, Hiromichi Ohno, Masayoshi Yamamoto (Nagoya Univ.) WPT2020-47
We demonstrated a 27.12MHz dynamic wireless power transfer using a model car in the Movie Contest of Dynamic Wireless Po... [more] WPT2020-47
pp.67-72
DC 2021-02-05
11:35
Online Online A Novel High Performance Scan-Test-Aware Hardened Latch Design
Ruijun Ma, Stefan Holst, Xiaoqing Wen (KIT), Aibin Yan (AHU), Hui Xu (AUST) DC2020-71
As modern technology nodes become more and more susceptible to soft-errors, many radiation hardened latch designs have b... [more] DC2020-71
pp.12-17
CPSY, RECONF, VLD, IPSJ-ARC, IPSJ-SLDM [detail] 2021-01-26
12:45
Online Online SLM based FPGA-IP soft core
Yuya Nakazato, Hiroaki Koga (Kumamoto Univ.), Zhao Qian (KIT), Motoki Amagasaki, Morihiro Kuga, Masahiro Iida (Kumamoto Univ.) VLD2020-61 CPSY2020-44 RECONF2020-80
In the recent edge computing infrastructure, MEC (Multi-access Edge Computing) devices is considered to reduce the load ... [more] VLD2020-61 CPSY2020-44 RECONF2020-80
pp.125-130
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-17
10:30
Online Online Power Analysis Based on Probability Calculation of Small Regions in LSI
Ryo Oba, Ryu Hoshino, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32
Power consumption in LSI testing is higher than in functional mode since more switching activities occur. High power con... [more] VLD2020-13 ICD2020-33 DC2020-33 RECONF2020-32
pp.12-17
VLD, DC, RECONF, ICD, IPSJ-SLDM
(Joint) [detail]
2020-11-18
13:00
Online Online [Keynote Address] Quality Assurances of the Fugaku Supercomputer: Function, Performance and Power
Takahide Yoshikawa (FLAB) VLD2020-36 ICD2020-56 DC2020-56 RECONF2020-55
The Fugaku Supercomputer has about 160,000 CPUs, and once a problem occurs after assembling, it is challenging to fix. I... [more] VLD2020-36 ICD2020-56 DC2020-56 RECONF2020-55
p.138
CPSY, DC, IPSJ-ARC [detail] 2020-07-31
15:45
Online Online A Multiple Target Test Generation Method for Gate-Exhaustive Faults to Reduce the number of Test Patterns
Ryuki Asami, Toshinori Hosokawa (Nihon Univ.), Masayoshi Yoshimura (Kyoto Sangyo Univ.), Masayuki Arai (Nihon Univ.) CPSY2020-12 DC2020-12
In recent years, as the high density and complexity of integrated circuits have increased, defects in cells have increas... [more] CPSY2020-12 DC2020-12
pp.75-80
NC, MBE
(Joint)
2020-03-05
09:30
Tokyo University of Electro Communications
(Cancelled but technical report was issued)
Pupillary responses during Dementia tests
Wioletta Nowak (Wroclaw Univ. of S&T), Minoru Nakayama (Tokyo Tech.), Elzbieta Trypka (Wroclaw Medical Univ.), Anna Zarowska (Wroclaw Univ. of S&T) MBE2019-81
Pupillary responses were observed during dementia test for three
subject's groups: Alzheimer's Disease (AD) patients, ... [more]
MBE2019-81
pp.1-4
CS, CAS 2020-02-27
11:45
Kumamoto   Detecting Resistive-Open Defects of Power TSVs in 3D-ICs
Koutaro Hachiya (Teikyo Heisei Univ.), Atsushi Kurokawa (Hirosaki Univ.) CAS2019-104 CS2019-104
A method is proposed which detects resistive-open defects of power TSVs in PDNs by measuring resistance between power mi... [more] CAS2019-104 CS2019-104
pp.37-41
DC 2020-02-26
11:35
Tokyo   Method for Inserting Fault-Detection-Strengthened Test Point under Multi-cycle Testing
Tomoki Aono, Norihiro Nakaoka, Shyu Saikou, Wang Senling, Higami Yoshinobu, Hiroshi Takahashi (Ehime Univ.), Hiroyuki Iwata, Youichi Maeda, Jun Matsushima (Renesas) DC2019-89
For guaranteeing the functional safety of an in-vehicle system, a power-on self-test (POST) is required to test the devi... [more] DC2019-89
pp.19-24
DC 2020-02-26
14:10
Tokyo   A Don’t Care Identification-Filling Co-Optimization Method for Low Power Testing Using Partial Max-SAT
Kenichiro Misawa, Toshinori Hosokawa, Hiroshi Yamazaki (Nihon Univ), Masayoshi Yoshimura (Kyouto Sangyo Univ), Masayuki Arai (Nihon Univ) DC2019-92
Recently, in at-speed scan testing, excessive capture power dissipation is a serious problem. Low capture power test gen... [more] DC2019-92
pp.37-42
DC 2020-02-26
14:35
Tokyo   Power Analysis for Logic Area of LSI Including Memory Area
Yuya Kodama, Kohei Miyase, Daiki Takafuji, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2019-93
Power consumption during LSI testing is higher than functional mode. Excessive IR-drop causes excessive delay, resulting... [more] DC2019-93
pp.43-48
DC 2020-02-26
15:00
Tokyo   Improving Controllability of Signal Transitions in the High Switching Area of LSI
Jie Shi, Kohei Miyase, Xiaoqing Wen, Seiji Kajihara (Kyutech) DC2019-94
Power consumption in LSI testing is larger than in functional mode. High power consumption causes excessive IR-drop and ... [more] DC2019-94
pp.49-54
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