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Technical Committee on Electromagnetic Theory (EMT)  (Searched in: 2022)

Search Results: Keywords 'from:2022-06-23 to:2022-06-23'

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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 6 of 6  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
EMT, IEE-EMT 2022-06-23
Tokyo The Institute of Electrical Engineers of Japan Extension of Dirac equation by the charge creation-annihilation field and simulation for formation process of atomic orbitals by FDTD method
Hideki Mutoh (Link Research) EMT2022-1
We have reported that Maxwell's equations should be extended by using the charge creation-annihilation field to treat th... [more] EMT2022-1
EMT, IEE-EMT 2022-06-23
Tokyo The Institute of Electrical Engineers of Japan 1-D Circular Near Field to Far Field Radar Cross Section Transformation by Using a Weight Function Based on Cylindrical Wave Expansion
Yoshihiko Akamine, Takashi Tomura, Joro Hirokawa (Titech) EMT2022-2
This paper proposes a new near field to far field transformation method for radar cross section measure ments with a one... [more] EMT2022-2
EMT, IEE-EMT 2022-06-23
Tokyo The Institute of Electrical Engineers of Japan Diffraction of an E-polarized plane wave by a slit in a thin conducting screen -- Derivation of a solution incorporating arbitrary edge property --
Hirohide Serizawa (NIT, Numazu College), Mikito Takahashi (Tokyo Univ.) EMT2022-3
The diffraction of an E-polarized electromagnetic plane wave by a slit in a perfect conducting screen with an infinitesi... [more] EMT2022-3
EMT, IEE-EMT 2022-06-23
Tokyo The Institute of Electrical Engineers of Japan Analysis of Pulse Response for Dispersion Medium Embedded with Alternately Conducting Strips -- Investigation into the Effects of Higher order by Incident Pulse --
Ryosuke Ozaki, Chun Wang, Tsuneki Yamasaki (Nihon Univ.) EMT2022-4
 [more] EMT2022-4
EMT, IEE-EMT 2022-06-23
Tokyo The Institute of Electrical Engineers of Japan Shape tolerance analyes of three-dimensional fine-defect discrimination on dielectric surface using optical linear discrimination analysis
Shingo Shimada, Jun-ichiro Sugisaka, Koichi Hirayama, Takashi Yasui (Kitami Inst.Tech.) EMT2022-5
Measurement of a fine defect on a dielectric substrate is difficult because the relationship between the defect shape an... [more] EMT2022-5
EMT, IEE-EMT 2022-06-23
Tokyo The Institute of Electrical Engineers of Japan Reflectarray Constructed by L-shaped Elements with Wideband Polarization Conversion Property
Sota Tanizawa, Kento Kitai, Deguchi Hiroyuki, Tsuji Mikio (Doshisha Univ.) EMT2022-6
 [more] EMT2022-6
 Results 1 - 6 of 6  /   
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