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Technical Committee on Reliability (R)  (Searched in: 2015)

Search Results: Keywords 'from:2015-11-19 to:2015-11-19'
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Search Results: Conference Papers
 Conference Papers (Available on Advance Programs)  (Sort by: Date Ascending)
 Results 1 - 5 of 5  /   
Committee Date Time Place Paper Title / Authors Abstract Paper #
R 2015-11-19
14:00		 Osaka   Reliability Analysis Based on Hierarchical Bayesian Models and Filtering Methodologies
Toru Kaise (Univ. of Hyogo) R2015-56		  [more] R2015-56
pp.1-4
R 2015-11-19
14:25		 Osaka   A Measurement Method for the Extent of Simultaneous Soft Errors
Noboru Masuda, Moritoshi Yasunaga (Univ. of Tsukuba) R2015-57		 Regarding the LSI soft error caused by the neutron beam, a single particle of neutron may cause multiple chained soft er... [more] R2015-57
pp.5-10
R 2015-11-19
14:50		 Osaka   Observation of Power MOSFET under UIS avalanche breakdown condition using thermoreflectance image mapping
Koichi Endo (Toshiba Corp.), Tomonori Nakamura (Hamamatsu Photonics K.K.), Koji Nakamae (Osaka Univ.) R2015-58		 We investigate the temperature variation of the top surface image of power metal-oxide semiconductor field effect transi... [more] R2015-58
pp.11-16
R 2015-11-19
15:30		 Osaka   A reliability test planning of electronic components for assurance of quality
Toshinari Matsuoka (Mitsubishi Electric) R2015-59		  [more] R2015-59
pp.17-22
R 2015-11-19
15:55		 Osaka   A Study on acceleration test for Life-End Evaluation
Sadanori Ito (ITOKEN) R2015-60		  [more] R2015-60
pp.23-26
 Results 1 - 5 of 5  /   
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