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Presentation |
2014-01-24 09:55
Development of Nb/Al bi-layer MKID camera
-- Temperature dependence of quality factor -- Masakazu Sekine, Yutaro Sekimoto (Univ. of Tokyo), Takashi Noguchi, Akihira Miyachi, Kenichi Karatsu (NAOJ), Tom Nitta (Univ. of Tsukuba), Shigeyuki Sekiguchi, Takashi Okada (NAOJ), Masato Naruse (Saitama Univ) |
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SCE2013-47 Link to ES Tech. Rep. Archives: SCE2013-47 |
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