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| Presentation | 2015-07-24 15:10 Band alignment at SiO2/β-Ga2O3 interface determined by X-ray photoelectron spectroscopy Keita Konishi, Takafumi Kamimura, Man Hoi Wong (NICT), Kohei Sasaki, Akito Kuramata, Shigenobu Yamakoshi (MURA Corp.), Masataka Higashiwaki (NICT) |
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| PDF Download Link |  ED2015-40 Link to ES Tech. Rep. Archives: ED2015-40 |
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