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| Presentation | 2019-05-16 14:40 Characterizations of lattice strain and optical properties for Ge layers epitaxially grown on bonded Si-on-Quartz substrate Kyosuke Noguchi (Toyohashi Univ. Tech.), Michiharu Nishimura (Univ. Tokyo), Junji Matui, Yoshiyuki Tsusaka (Univ. Hyogo), Yasuhiko Ishikawa (Toyohashi Univ. Tech.) |
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| PDF Download Link |  ED2019-14 CPM2019-5 SDM2019-12 Link to ES Tech. Rep. Archives: ED2019-14 CPM2019-5 SDM2019-12 |
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