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| Presentation | 2023-01-27 11:00 Measurement Evaluation of Bias Dependence of Single-Input Broadband GaN Amplifier Yuki Nakagawa, Takana Kaho (Shonan Inst. Tech.), Shuichi Sakata, Yuji Komatsuzaki, Koji Yamanaka (MELCO) |
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| PDF Download Link |  ED2022-89 MW2022-148 |
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