IEICE Technical Report

Print edition: ISSN 0913-5685
Online edition: ISSN 2432-6380

vol. 105, no. 214

Electromagnetic Compatibility

Workshop Date : 2005-07-29 / Issue Date : 2005-07-22

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EMCJ2005-53
Electromagnetic Analysis for Nuisance action of Electric Unit caused by Electromagnetic noise
Yasuhiro Shiraki (Mitsubishi Electric Corp.)
pp. 1 - 5

EMCJ2005-54
Examination for imbalance matching at receiver terminal in high speed differential transmission system
Kazuya Morimitsu, Hiroshi Shigenari, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.), Osami Wada (Kyoto Univ.)
pp. 7 - 12

EMCJ2005-55
Experimental Study on Electromagnetic Coupling between Interconnection on Chip
Toshiyuki Agatsuma, Hiroshi Inoue (Akita Univ)
pp. 13 - 18

EMCJ2005-56
Consideration on acceleration reliability of Lead Free coil solder joint
Ichizo Sakamoto (Omron)
pp. 19 - 22

EMCJ2005-57
An Experimental Study of Arc Duration and Transition from Metallic to Gaseous Phase in Ag Alloy Break Arc -- Effect of Source Voltage --
Kiyoshi Yoshida (Nippon institute of technology)
pp. 23 - 28

EMCJ2005-58
[Special Talk] Electrical Contacts and EMC
Tasuku Takagi (Tohoku Univ.)
pp. 29 - 34


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan