Print edition: ISSN 0913-5685
Online edition: ISSN 2432-6380
[TOP] | [2006] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [Japanese] / [English]
ICD2005-106
[Invited Talk]
The study of the high frequency electrical characteristics in high-speed digital device mounting
Chihiro Ueda (AETJAPAN)
pp. 1 - 5
ICD2005-107
Analysis of Transmission Characteristic of High-speed Differential Sgnal Bus
Tsuyoshi Tokiwa, Toshio Sudo (Toshiba), Nobuhiro Tsuruta (Toshiba DME), Yoshihiro Nishida (Toshiba DM)
pp. 7 - 12
ICD2005-108
Measuemnt and Discussion of Degradation of Pulse Feature according with Line Length Increase
Koichi Yabuuchi (EMtech), Tamotsu Usami, Yutaka Akiyama, Kanji Otsuka (Meisei Univ.)
pp. 13 - 16
ICD2005-109
Lead-free bumping and its process integrity for fine pitch interconnects
Hirokazu Ezawa, Masaharu Seto, Kazuhito Higuchi (Toshiba)
pp. 17 - 22
ICD2005-110
Development of New Surface Finish Technology for Package Substrates with Excellent Bondability
Kiyotaka Tsukada (IBIDEN)
pp. 23 - 27
ICD2005-111
Simultaneous switching noise(SSN) and EMI of a semiconductor package
Takanobu Kushihira (MSC), Toshio Sudo (TSB)
pp. 29 - 34
ICD2005-112
Study of 6Gbps Operation on 0.18um Node CMOS I/O Inverter with Transmission Structure in Signal and Power Distribution Lines
Yutaka Akiyama (Meisei Univ.), Tsuneo Ito (Excel Service), Kyouji Ito (Renesas NJS), Kanji Otsuka (Meisei Univ.)
pp. 35 - 40
ICD2005-113
Measurement of Inner-chip Variation and Signal Integrity By a 90-nm Large-scale TEG
Masaharu Yamamoto (STARC), Yayoi Hayasi, Hitoshi Endo (Hitachi ULSI), Hiroo Masuda (STARC)
pp. 41 - 46
ICD2005-114
[Invited Talk]
On chip transmission line interconnect
Kazuya Masu, Kenichi Okada, Hiroyuki Ito (Tokyo Institute of Technology)
pp. 47 - 52