IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 107, Number 4

Software Science

Workshop Date : 2007-04-19 - 2007-04-20 / Issue Date : 2007-04-12

[PREV] [NEXT]

[TOP] | [2006] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [Japanese] / [English]

[PROGRAM] [BULK PDF DOWNLOAD]


Table of contents

SS2007-1
A Study of Unit Testing with Orthogonal Array -- A Support Tool for JUnit --
Akira Yamada (NEC), Hirohisa Aman, Yuzo Takamatsu (Ehime Univ.)
pp. 1 - 6

SS2007-2
A study of applying formal methods to enterprise architecture of Japanese governmental corporations
Takahiro Seino, Osamu Takaki, Izumi Takeuti, Koichi Takahashi, Noriaki Izumi (AIST)
pp. 7 - 12

SS2007-3
Spectrum Analysis of an Application Domain by using Software Quality Characteristics
Tomonori Sato, Akira Osada, Naoyuki Kitazawa, Haruhiko Kaiya, Kenji Kaijiri (ShinShu u)
pp. 13 - 18

SS2007-4
Providing Domain Knowledge to System Engineers based on their Knowledge
Daigo Ozawa, Akira Osada, Naoyuki Kitazawa, Haruhiko Kaiya, Kenji Kaijiri (SU)
pp. 19 - 24

SS2007-5
The empirical study of unified type requirement engineering
Shozo Hori (KIT), Takako Nakatani (Tsukuba), Keiichi Katamine, Naoyasu Ubayashi, Masaaki Hashimoto (KIT)
pp. 25 - 28

SS2007-6
A Method of Detecting Security Flaws in Web Sessions through Model Checking
Ikuya Morikawa, Yuji Yamaoka, Yuko Nakayama (Fujitsu Labs.)
pp. 29 - 34

SS2007-7
Change Impact Analysis tool for UML diagrams
Masayuki Kotani, Takumi Sugai, Koichiro Ochimizu (JAIST)
pp. 35 - 39

SS2007-8
Selecting metrics for effective software quality management using over-sampling method
Yusuke Sasaki, Seiya Abe, Osamu Mizuno, Tohru Kikuno (Osaka Univ.), Sachie Yoshioka, Yoshiyuki Anan, Mataharu Tanaka (OMRON Software)
pp. 41 - 46

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan