IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Superconductive Electronics

Workshop Date : 2008-10-30 / Issue Date : 2008-10-23

SCE2008-22
[Invited Talk] REGQ Technologies for Very High End Computing
John Spargo (Northrop Grumman Space Technology)
pp. 1 - 4

SCE2008-23
[Invited Talk] SFQ Technology Developments in NEDO Next-Generation High-Efficiency Network Device project
Mutsuo Hidaka (SRL)
pp. 5 - 10

SCE2008-24
[Invited Talk] JST and MEXT SFQ Device Projects -- For New Innovation of SFQ Electronics --
Akira Fujimaki (Nagoya Univ.)
pp. 11 - 16

SCE2008-25
Design of SFQ circuits using logic cells directly connectable to PTLs
Hidetoshi Suzuki, Hiroshi Hara, Yuki Yamanashi, Nobuyuki Yoshikawa (Yokohama National Univ)
pp. 17 - 22

SCE2008-26
Mutual Inductance between Two Superconducting Lines Parallely-Placed in Nb Integrated Circuits
Akio Kawai, Ryuta Kashiwa, Masataka Moriya, Tadayuki Kobayashi, Yoshinao Mizugaki (UEC)
pp. 23 - 28

SCE2008-27
Demonstration of a Single-Flux-Quantum Floating-Point Divider for the Reconfigurable Data-path
Masamitsu Tanaka, Koji Obata, Kazuyoshi Takagi, Naofumi Takagi (Nagoya Univ.), Nobuyuki Yoshikawa (Yokohama National Univ.)
pp. 29 - 34

SCE2008-28
Design and test of memory system in the SFQ-FFT processor
Kazuhiro Taketomi, Yuki Yamanashi, Heejoung Park, Nobuyuki Yoshikawa (YNU)
pp. 35 - 38

SCE2008-29
Automated Routing Method for Multi-Layer SFQ Circuits
Shota Takeshima, Masamitsu Tanaka, Kazuyoshi Takagi, Naofumi Takagi (Nagoya Univ.)
pp. 39 - 44

SCE2008-30
Investigation of Inductively Coupled SFQ Pulse Transfer Circuits for Current Recycling
Masanori Igarashi, Yuki Yamanashi, Nobuyuki Yoshikawa (Yokohama National Univ.), Kan Fujiwara, Yoshihito Hashimoto (SRL)
pp. 45 - 50

SCE2008-31
Research on effective moat configuration for Nb multi-layer device structure for a cell library
Kan Fujiwara, Shuichi Nagasawa, Mutsuo Hidaka (SRL/CREST-JST), Nobuyuki Yoshikawa (Yokohama National Univ./CREST-JST), Masamitsu Tanaka, Hiroyuki Akaike, Akira Fujimaki, Kazuyoshi Takagi, Naofumi Takagi (Nagoya Univ./CREST-JST)
pp. 51 - 56

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan