Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380
[TOP] | [2006] | [2007] | [2008] | [2009] | [2010] | [2011] | [2012] | [Japanese] / [English]
WBS2008-46
Proposal of synchronous acquisition method in OFDM/MC-CDMA
Koji Yokoyama, Shin'ichi Tachikawa (Nagaoka University of Technology)
pp. 1 - 6
WBS2008-47
On Code-Diversity and Partial Correlation Weight Coefficient Control Techniques in DS/CDMA
Shiki Suzuki, Shin'ichi Tachikawa (Nagaoka University of Technology)
pp. 7 - 12
WBS2008-48
An Extending of MMFSK-EOD Systems Using Binary Hopping Patterns
Suguru Hasegawa, Shin'ichi Tachikawa, Gen Marubayashi (Nagaoka Univ. of Tec.)
pp. 13 - 18
WBS2008-49
[Invited Talk]
Review of Radio Propagation of Ultra Wideband Signals and Their Electromagnetic Compatibility with Incumbent Narrowband Systems
-- In Commemoration of the 2008 IEICE Achivement Award --
Takehiko Kobayashi (Tokyo Denki Univ.), Jun-ichi Takada (Tokyo Inst. of Tech)
pp. 19 - 24
WBS2008-50
[Encouragement Talk]
Microwave and Ultra-Wideband Channel Estimation Based on Measurements
Naohiko Iwakiri (Tokyo Denki Univ.)
pp. 25 - 30
WBS2008-51
An Optimized SAW Chirp-Z Transform for OFDM Systems
Takaya Watanabe (World Technology Instrument Co., Ltd.)
pp. 31 - 36
WBS2008-52
Simulation of Interference Effects of UWB Systems on a Narrowband QPSK Digital Transmission System in Fading Environments
Yosuke Iuchi (Tokyo Denki Univ.), Atsushi Tomiki (Japan Aerospace Exploration Agency), Takehiko Kobayashi (Tokyo Denki Univ.)
pp. 37 - 42
WBS2008-53
Distance-Dependent Threshold for UWB Ranging
Marzieh Dashti, Mir Ghoraishi, Jun-ichi Takada (Tokyo Inst. of Tech.), Katsuyuki Haneda (Helsinki Univ. of Tech.), Ken-ichi Takizawa (National Inst. of Inf/ Communications Tech.)
pp. 43 - 48
WBS2008-54
[Invited Talk]
Regulatory Status of Quasi-Millimeter wave Short-Range Radar for Automobile in Japan
Yasushi Aoyagi (The Furukawa Electric Co.,Ltd.)
pp. 49 - 52
WBS2008-55
[Invited Talk]
Self-reconfigurable and locomotive modular robot
Haruhisa Kurokawa (National Inst. of Adv Ind Scie Tech.)
p. 53
Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.