IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 108, Number 95

Reliability

Workshop Date : 2008-06-20 / Issue Date : 2008-06-13

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Table of contents

R2008-15
An extended priority AND gate and its quantitative analysis
Koichi Suyama, Nobuko Kosugi (Tokyo Univ. of Marine Science and Tech.)
pp. 1 - 8

R2008-16
A consideration on estimation of the Weibull parameters
Hideki Nagatsuka (Tokyo Metropolitan Univ.), Toshinari Kamakura (Chuo Univ.)
pp. 9 - 14

R2008-17
Simulated Annealing for Solving Optimal Component Arrangement Problems in a Circular Consecutive-k-out-of-n:F System
Koji Shingyochi (Jumonji Univ.), Hisashi Yamamoto (Tokyo Metropolitan Univ.)
pp. 15 - 20

R2008-18
Industrial Unified Controller nv series -- Improvement of reliability --
Naruhiko Aramaki, Hiroyuki Kusakabe (Toshiba)
pp. 21 - 24

R2008-19
Improvement of Quality Awareness through LSI Evaluation and Analysis -- Trial at University --
Masaru Sanada (KUT)
pp. 25 - 30

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan