IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 109, Number 185

Electromagnetic Compatibility

Workshop Date : 2009-09-04 / Issue Date : 2009-08-28

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Table of contents

EMCJ2009-35
Examination of EMC Macro Model LECCS-I/O with Two Current Sources Simulating Power and Output Currents of CMOS Inverter IC
Tomoya Tasaka, Norimasa Oka, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.)
pp. 1 - 6

EMCJ2009-36
Evaluation of Ferromagnetic Thin Film RF Noise Suppressor applied to On-Chip Transmission Lines for the Purpose of Noise Suppression in Semiconductor Devices
Sho Muroga, Yasushi Endo, Mitsuru Suzuki, Takayoshi Inagaki, Yoshio Mitsuzuka, Masahiro Yamaguchi (Tohoku Univ.)
pp. 7 - 12

EMCJ2009-37
Electromagnetic Field Analysis Based on GPGPU-FDTD method and Performance Estimation
Masaki Unno, Yuta Inoue, Hideki Asai (Shizuoka Univ.)
pp. 13 - 17

EMCJ2009-38
A trial of blind source separation in radio communication
Takaaki Ishibashi, Eiji Nishiyama, Toyonori Matsuda (Kumamoto National Coll. of Tech.), Hiromu Gotanda (Kinki Univ.)
pp. 19 - 22

EMCJ2009-39
A study on the influence of power transmission line facilities on the input impedance of a Medium-Wave broadcasting antenna
Toyonori Matsuda, Eiji Nishiyama, Takaaki Ishibashi, Yoshifumi Shimoshio (Kumamoto National Coll. of Tech.), Kazuya Murakami, Teruaki Imamura, Shigeki Matsuzaki (Kyushu Denryoku Co.,Ltd.,), Kenji Taguchi (Kitami Inst. of Tech.)
pp. 23 - 28

EMCJ2009-40
Leaked Emissions due to the In-House Broadband Powerline Communications (1) -- Measurements of the Electric Field Strength at a Distance and Direct Measurements of the Common-Mode Current --
Masatoshi Ohishi (NAOJ), Masahiro Kitagawa, Hiroaki Misawa, Fuminori Tsuchiya (Osaka Uhiv.)
pp. 29 - 34

EMCJ2009-41
Hierarchical Clustering-based Analysis of Telephone-Audible Noise
Norihito Hirasawa, Masao Masugi (NTT)
pp. 35 - 40

EMCJ2009-42
UWB Body Area Channel Measurement and Communication Performance Simulation
Ippei Kimura, Qiong Wang, Jianqing Wang (Nagoya Inst. of Tech.)
pp. 41 - 46

EMCJ2009-43
[Special Talk] ISO/IEC 17025 Laboratory Accreditation scheme and its application to EMC laboratory
Koichi Sazanami (JAB)
pp. 47 - 52

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan