IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 109, Number 40

Software Science

Workshop Date : 2009-05-21 - 2009-05-22 / Issue Date : 2009-05-14

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Table of contents

SS2009-1
Aspect oriented requirement extraction procedure and its application of office design
Komon Ibe (NTT DATA Co./Kyushu Univ.), Shinobu Saito (NTT DATA Co.)
pp. 1 - 6

SS2009-2
Requirement Analysis Technique based on Business Situation and User Dependency
Shinobu Saito, Komon Ibe (NTT Data)
pp. 7 - 11

SS2009-3
An Integrated CASE Tool for Supporting Attributed Goal-Oriented Requirements Analysis Method
Motoshi Saeki, Shinpei Hayashi (Tokyo Inst. of Tech.), Haruhiko Kaiya (Shinshu Univ.)
pp. 13 - 18

SS2009-4
A Comparing Analysis for Software Analysis Techniques based on activated pattern of cerebral cortex
Mikio Ohki, Toshiki Uehara, Haruki Murase (Nippon Inst. of Tech.)
pp. 19 - 24

SS2009-5
Issues on Analysis Large Dependable System
Shuichiro Yamamoto, Masakazu Kanbe (NTT DATA), Shaoying Liu (Hosei Univ.)
pp. 25 - 30

SS2009-6
Proposal and Implementation of Feature Model Drawing Algorithm
Masaaki Hasuo, Tsuneo Nakanishi, Shigeaki Tagashira, Yutaka Arakawa, Kenji Hisazumi, Akira Fukuda (Kyushu Univ.)
pp. 31 - 36

SS2009-7
A Design Model Based Methodology for Test Case Extraction and Test Data Generation
Xiaojing Zhang, Takashi Hoshino (NTT)
pp. 37 - 42

SS2009-8
Modeling and Verification of Web Applications Using Formal Approach
Kei Homma (Miyagi Univ.), Kaoru Takahashi (Sendai National Coll. of Tech.), Atsushi Togashi (Miyagi Univ.)
pp. 43 - 48

SS2009-9
An SOS interpreter with negative premises and an equivalence checker by Maude
Jun Ban, Keigo Imai, Shoji Yuen (Nagoya Univ.)
pp. 49 - 54

SS2009-10
Reuse of the estimation model of error-prone module
Shinya Watanabe, Haruhiko Kaiya, Kenji Kaijiri (Shinshu Univ.)
pp. 55 - 60

SS2009-11
An Application of Control Chart and Growth Curve Model for Estimating Number of Bugs in Open Source Development
Takahiro Ohkochi, Hirohisa Aman (Ehime Univ.)
pp. 61 - 66

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan