IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 110, Number 125

Electromagnetic Compatibility

Workshop Date : 2010-07-15 / Issue Date : 2010-07-08

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Table of contents

EMCJ2010-21
Evaluation of immunity characteristics for power supply terminal of RF components
Fujiyuki Nakamoto, Takeshi Uchida, Chiharu Miyazaki, Naoto Oka, Koichiro Misu (Mitsubishi Electric Corp.)
pp. 1 - 4

EMCJ2010-22
A Proposal of Near-Field-Measurement Technique in Complex Complex
Toshihiro Takatsu, Fengchao Xiao (Univ. of Electro-comm.), Kimitoshi Murano (Tokai Univ.), Yoshio Kami (Univ. of Electro-comm.)
pp. 5 - 10

EMCJ2010-23
Measurement of Cole-Cole Plot for Wine with an Open Ended Coaxial Probe
Yusuke Sato, Yusuke Kazama, Yoshinori Taka, Osamu Fujiwara (Nagoya Inst. of Tech.)
pp. 11 - 14

EMCJ2010-24
Estimation of Whole-Body Average SARs in Human for Vertical Polarized Far-Field Exposure at Frequencies over 1 GHz Using Spatially Averaged Squares of Induced Currents
Tokio Suzuki, Akimasa Hirata, Osamu Fujiwara (Nagoya Inst. of Tech.), Tomoaki Nagaoka, Soichi Watanabe (NICT)
pp. 15 - 19

EMCJ2010-25
Evaluation Method for EMI of an Implanted Device by Wireless Devices Using Near-field EMF
Satoshi Ishihara, Takahiro Iyama, Teruo Onishi, Yoshiaki Tarusawa (NTT DOCOMO)
pp. 21 - 26

EMCJ2010-26
Estimation of Current Sources Magnitude Using Improved SPM Method
Yuan Zhen, Jerdvisanop Chakarothai, Qiang Chen, Kunio Sawaya (Tohoku Univ.)
pp. 27 - 31

EMCJ2010-27
Examination of Reduction Technique for Radiation noise from the power suppy layers in PCB -- Power supply layers shape --
Hitoshi Takakura, Shinichi Sasaki (Saga Univ.)
pp. 33 - 38

EMCJ2010-28
Effective Position of Decoupling Inductor Taking Parasitic Capacitances on Power Distribution Network Traces into Account
Yusuke Yano, Kengo Iokibe, Yoshitaka Toyota, Ryuji Koga (Okayama Univ.)
pp. 39 - 44

EMCJ2010-29
Selection of position of equivalent current source in LSI linear macro-model using Norton equivalent circuit in transient domain
Teruyoshi Yamasaki, Hiroshi Tanaka, Tohlu Matsushima, Takashi Hisakado, Osami Wada (Kyoto Univ.)
pp. 45 - 50

EMCJ2010-30
Relationship between Contact Point Distribution and Common-Mode Current on Connector with Contact Failure
Yu-ichi Hayashi, Takaaki Mizuki, Hideaki Sone (Tohoku Univ.)
pp. 51 - 54

EMCJ2010-31
Time Domain Analysis of Single Conductor Line Using Propagating Line Current
Yoshinobu Wada, Takashi Hisakado, Osami Wada (Kyotu Univ.)
pp. 55 - 60

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan