IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 110, Number 451

Electromechanical Devices

Workshop Date : 2011-03-04 / Issue Date : 2011-02-25

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Table of contents

EMD2010-152
A study of transfer concerning W based composite materials containing WS2 for low speed sliding test
Masaomi Arai, Yoshitada Watanabe, Kota Kawana (Kogakuin Univ.)
pp. 1 - 4

EMD2010-153
A comparative study of sliding characteristics of Cu-Ni based composite materials and W based composite materials
Ryohei Saito, Yoshitada Watanabe, Kohei Maruyama (Kogakuin Univ.)
pp. 5 - 8

EMD2010-154
Research on sliding characteristic of copper, silver slipring, with carbon, silver brush under atmosphere change
Takuro Yotsukura, Syota Kodama, Hiroyuki Sato, Koichiro Sawa, Noboru Morita, Takahiro Ueno (Nippon Inst. of Tech.)
pp. 9 - 12

EMD2010-155
Study for the structure of copper surface film in the growing process by thermal oxidation
Rikuya Ikuta, Takashi Umahashi, Isao Minowa (Tamagawa Univ.)
pp. 13 - 16

EMD2010-156
Fabrication of LC filter circuit for the measurement of resistor's distortion voltage
Masaya Ikeda, Isao Minowa, Hiroshi Kikuchi (Tamagawa Univ.)
pp. 17 - 20

EMD2010-157
Evaluation of Contact Probe for Contact Resistance Measurement
Satoru Oohira, Soushi Masui, Shigeru Sawada, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (AN-Tech)
pp. 21 - 24

EMD2010-158
Observation of Tin Plated Point of Contacts
Yusuke Mori, Kazuo Iida, Yasushi Saitoh, Shigeru Sawada (Mie Univ.), Yasuhiro Hattori (AutoNetworks Technologies, Ltd)
pp. 25 - 28

EMD2010-159
Influence of Thermal Environments for Connectors on Vehicle
Jin Hirabayashi, Yuya Saruwatari, Yasushi Saitoh, Terutaka Tamai, Kazuo Iida (Mie Univ), Yasuhiro Hattori (ANT)
pp. 29 - 32

EMD2010-160
Comparison of hauling force between series & parallel connection of electric motor by readhesion control in 5-inches large model electric locomotive
Hideyuki Watanabe, Hidenori Ito, Daichi Kawarahata, Naohiro Saito, Yu Yifan, Kiyoshi Onodera, Lu Zijun, Makoto Takanezawa, Noboru Morita (Nippon Inst. of Tech.)
pp. 33 - 36

EMD2010-161
In Vitro Measurement by Vibration Scanning Method for Puncture Needle-Type Ultrasonography
Masayuki Kiya, Kouichi Karasawa, Masasumi Yoshizawa (Tokyo Metropolitan Coll. of Ind Tech.), Takasuke Irie (Microsonic co., ltd.), Tadashi Moriya (Tokyo Metro Univ.), Kouichi Itoh (Hitachi-Omiya Saiseikai Hospital)
pp. 37 - 40

EMD2010-162
Observation of Current Flow Point in Contact Surface of a Current Collecting Mechanism
Hideki Kitajima, Hiroki Ryobuchi, Syota Ogawa, Koichiro Sawa, Takahiro Ueno (Nippon Inst. of Tech.)
pp. 41 - 44

EMD2010-163
A study of optimum dimension of the interpole tip width for increase the output power to DC machine
Shinya Endou, Kazunari Matsushita, Zhang Qingliang, Takahiro Ueno, Noboru Morita (Nippon Inst. of Tech.)
pp. 45 - 48

EMD2010-164
Reliability of DC motor driving automotive fuel pump in various fuels
Daichi Kumakiri, Akihisa Yamaguchi, Hidenori Tanaka, Liu Liqing, Koichiro Sawa, Takahiro Ueno (Nippon Inst. of Tech.)
pp. 49 - 52

EMD2010-165
An experimental study on an evaluation system of a contact surface profile with an optical cross-section method
Keisuke Takahashi, Makoto Hasegawa (Chitose Inst. of Sci & Tech.)
pp. 53 - 56

EMD2010-166
A study on rotation characteristics of speckle patterns observed in an output light spot from an optical fiber
Muneki Kawahara, Yusuke Takahashi, Makoto Hasegawa (Chitose Inst. of Sci & Tech)
pp. 57 - 60

EMD2010-167
Influence of source voltage on various characteristics of electromagnetic contactor with only break arc
Tomoya Kida, Wataru Tomitaka, Koichiro Sawa, Kiyoshi Yoshida (Nippon Inst. of Tech.)
pp. 61 - 64

EMD2010-168
Arking phenomena having the influence on the reliability for eathquake disaster prevention relays
Tomoki Doutou, Syunsuke Hara, Yoshitada Watanabe (Kogakuin Univ.)
pp. 65 - 68

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan