IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 111, Number 164

Dependable Computing

Workshop Date : 2011-07-28 / Issue Date : 2011-07-21

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Table of contents

DC2011-15
Proposal for High Efficient DVS Using Adaptive Redundancy of FUs
Yukihiro Sasagawa, Jun Yao, Takashi Nakada, Yasuhiko Nakashima (NAIST)
pp. 1 - 6

DC2011-16
Recent Research Trends on Transient-Fault-Tolerant Dependable Processors
Yoshifumi Koyama, Kenta Imai, Aromhack Saysanasongkham, Masayuki Arai, Satoshi Fukumoto (Tokyo Metropolitan Univ.)
pp. 7 - 12

DC2011-17
A Parallel Extended SAT Solver for Cardinality Constraints
XiaoJuan Xu, Yuji Yamane, Kazunori Ueda (Waseda Univ.)
pp. 13 - 18

DC2011-18
Deviation Detection for Supporting Open System Dependability
Midori Sugaya (Yokohama National Univ.), Hiroki Takamura (JST), Kimio Kuramitsu (Yokohama National Univ.)
pp. 19 - 24

DC2011-19
[Invited Talk] High reliability of IT operations in data center -- Taking our actual operation activity on 3.11 as an example --
Yoshiya Wada (Hitachi Information Systems)
pp. 25 - 26

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan