IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 112, Number 275

Software Science

Workshop Date : 2012-11-01 - 2012-11-02 / Issue Date : 2012-10-25

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Table of contents

SS2012-36
Weather change pattern generation algorithm for sightseeing scheduling
Hirokazu Katoh, Yoshihiro Murata (Hiroshima City Univ.)
pp. 1 - 6

SS2012-37
A SAT Encoding for Finding Operation Sequences of Malbolge that Implement Trit-wise Functions
Satoshi Ando, Masahiko Sakai, Toshiki Sakabe, Keiichirou Kusakari, Naoki Nishida (Nagoya Univ.)
pp. 7 - 12

SS2012-38
Node Query Preservation for Deterministic Linear Top-Down Tree Transducers
Kazuki Miyahara, Kenji Hashimoto, Hiroyuki Seki (NAIST)
pp. 13 - 18

SS2012-39
Application of formal methods to network behavior dependent systems
Nobuaki Yoshida (ASTEM), Han-Myung Chang, Atsushi Sawada (Nanzan Univ.), Yukihiro Nakamura (ASTEM)
pp. 35 - 40

SS2012-40
A discussion of fault patterns for concurrent systems
Han-Myung Chang, Masami Noro, Atsushi Sawada, Atsushi Yoshida, Yoshinari Hachisu, Reishi Yokomori (Nanzan Univ.)
pp. 41 - 46

SS2012-41
A Report on the 27th IEEE/ACM International Conference on Automated Software Engineering (ASE 2012)
Shinpei Hayashi (Tokyo Tech.), Katsuhisa Maruyama (Ritsumeikan Univ.), Motoshi Saeki (Tokyo Tech.)
pp. 75 - 80

SS2012-42
An Empirical Study of Clone Disappearances on Open Source Software Projects
Keisuke Hotta, Yoshiki Higo, Shinji Kusumoto (Osaka Univ.)
pp. 111 - 116

SS2012-43
A Clone Detection Approach for a Collection of Similar Large-Scale Software Products
Eunjong Choi (Osaka Univ.), Norihiro Yoshida (NAIST), Yoshiki Higo, Katsuro Inoue (Osaka Univ.)
pp. 117 - 121

SS2012-44
Extraction traceability links between requirements and implementation in the same series of software products
Ryosuke Tsuchiya, Hironori Washizaki, Yoshiaki Fukazawa (Waseda Univ.), Tadahisa Kato, Masumi Kawakami, Kentaro Yoshimura (Hitachi)
pp. 123 - 128

SS2012-45
A Method to Extract Use Cases From Web Applications With Analysis of Screenshot Trace
Tsubasa Oikawa, Toshihiro Kamiya (FUN)
pp. 129 - 134

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan