IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Electromechanical Devices

Workshop Date : 2013-01-25 / Issue Date : 2013-01-18

EMD2012-97
[Invited Talk] The latest trend of PCB pattern design technique for LSI stable operation, suppressing noise and high speed serial interface
Akihiro Tanaka, Hiroyuki Motoki, Hideyuki Nakanishi (Aica Kogyo)
p. 1

EMD2012-98
[Special Talk] Consideration of R & D through transition of speechpath switches
Takeshi Aoki (TANAKA Holdings)
pp. 3 - 8

EMD2012-99
Degradation Phenomenon of Electrical Contacts by using Micro-Sliding Mechanisms -- Anallysis of Time-Sequential Fluctuation Data (27) --
Shin-ichi Wada, Keiji Koshida (TMC), Shoko Nagai (Keio), Naoki Masuda, Akira Ishiguro, Kunio Yanagi, Hiroaki Kubota (TMC), Koichiro Sawa (NIT)
pp. 9 - 14

EMD2012-100
An experimental study on a 3-D shape observation system of a sample by employing a laser displacement sensor
Makoto Hasegawa, Daichi Kawamura, Keisuke Takahashi (Chitose Inst. of Science and Tech.)
pp. 15 - 19

EMD2012-101
Measurement of V-I Characteristics and Extinction Characeristics of Arcs between Tungsten Electrodes
Yusuke Mishima, Keiichi Suhara (TNCT)
pp. 21 - 26

EMD2012-102
A Study of Void Influence in Light Pipes by Use of Optical CAE
Shintaro Shimizu, Yasushi Kimura, Masaaki Katayama (Hitachi)
pp. 27 - 32

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan