IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 113, Number 80

Reliability

Workshop Date : 2013-06-14 / Issue Date : 2013-06-07

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Table of contents

R2013-16
Degradation diagnosis of LED by junction temperature shift
Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba)
pp. 1 - 6

R2013-17
A Study of the Cable Failure Diagnosis TDR Method of Network Devices
Takashi Kuwahara, Yoshihiro Akeboshi (Mitsubishi Electric), Seiichi Saito (Salesian Polytechnic)
pp. 7 - 12

R2013-18
Black Swan Strategies for Performance Management of Large-Scale Clouds
Marat Zhanikeev (Kyushu Inst. of Tech.)
pp. 13 - 16

R2013-19
Optimal Checkpoint Placement based on System Workload
Yuki Doi, Tadashi Dohi (Hiroshima Univ.)
pp. 17 - 22

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan