IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2015-06-19 / Issue Date : 2015-06-12

R2015-10
On a generalization of RBF networks by FGM copula
Shuhei Ota, Mitsuhiro Kimura (Hosei Univ.)
pp. 1 - 6

R2015-11
A Note on Software Aging Estimation Using Hidden Markov Model
Hiroyuki Okamura, Chao Luo, Tadashi Dohi (Hiroshima Univ.)
pp. 7 - 12

R2015-12
Software Reliability Assessment Based on Non-homogeneous Power Law Processes
Yasuhiro Saito, Tadashi Dohi (Hiroshima Univ.)
pp. 13 - 18

R2015-13
A Study of Short-time Evaluation Method for Aluminum Electrolytic Capacitor
Yuichi Sumimoto, Kazuya Murakami, Kenji Adachi (Toshiba)
pp. 19 - 24

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan