IEICE Technical Report

Print edition: ISSN 0913-5685 Online edition: ISSN 2432-6380

Reliability

Workshop Date : 2015-12-18 / Issue Date : 2015-12-11

R2015-61
A validation study of threshold methods in wavelet shrinkage estimation
Xiao Xiao (Tokyo Metropolitan Univ.)
pp. 1 - 6

R2015-62
Nonparametric Estimation Method for Trend Renewal Process Based on Failure Rate Function
Yasuhiro Saito, Tadashi Dohi (Hiroshima Univ.)
pp. 7 - 12

R2015-63
A Note on Optimal Allocation of Testing-Resources with Halstead Software Metrics
Hiroyuki Okamura, Min Gong, Tadashi Dohi (Hiroshima Univ.)
pp. 13 - 18

R2015-64
Trend on International Standardization of dependability -- Outline of IEC TC56 and agenda on international meeting(especially WG2) --
Fumiaki Harada (FXAT), Yoshiki Kinoshita, Makoto Takeyama (KU)
pp. 19 - 25

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.

The Institute of Electronics, Information and Communication Engineers (IEICE), Japan