IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 116, Number 182

Biometrics

Workshop Date : 2016-08-18 - 2016-08-19 / Issue Date : 2016-08-11

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Table of contents

BioX2016-7
A Study of Estimation of False Accept Rate for Biometric Performance Evaluation
Shigefumi Yamada, Shinzaki Takashi (FUJITSU LAB.)
pp. 1 - 5

BioX2016-8
A Proposal of Differential Biometric Authentication to Absorb Biometric Fluctuations:Preliminary experiment
Hiroaki Muramatsu, Masatsugu Niwayama, Masakatsu Nishigaki (Shizuoka Univ.)
pp. 7 - 11

BioX2016-9
[Invited Talk] Frontiers in Distributed Representations for Natural Language Processing
Naoaki Okazaki (Tohoku Univ.)
p. 13

BioX2016-10
Modification of Gabor filter which considering the difference in shooting angles, and evaluate recognition accuracy
Takanari Minamidani, Hideyasu Sai, Daishi Watabe (SIT)
pp. 15 - 19

BioX2016-11
Feature Extraction and Recognition Accuracy of ECG Waveform
Ryosuke Saito, Hiroyuki Yoshimura (Chiba Univ.)
pp. 21 - 26

BioX2016-12
Effect of Feature Selection for Gait Recognition on 5 Walking States Using Android Device
Yuji Watanabe, Sara San (Nagoya City Univ.)
pp. 27 - 32

BioX2016-13
A Study on Authentication System using the Coordinates and Writing Speeds of Segments Extracted from Sign Strokes on Tablet
Kazuya Tsubota, Keiko Masuda, Seiichirou Hangai (TUS)
pp. 33 - 38

BioX2016-14
Generalized Combined Segmentation-Verification for Multi-Script Signatures using Random-Impostor Training
Keigo Matsuda, Wataru Ohyama, Tetsushi Wakabayashi (Mie Univ.)
pp. 39 - 43

BioX2016-15
A Study on Convenient Key Update for Public Biometrics Infrastructure
Yosuke Kaga, Masakazu Fujio, Ken Naganuma, Kenta Takahashi (Hitachi)
pp. 45 - 50

BioX2016-16
Brute-force Attacks against Biometric Authentication Systems
Tetsushi Ohki, Akira Otsuka (AIST)
pp. 51 - 56

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan