IEICE Technical Report

Print edition: ISSN 0913-5685      Online edition: ISSN 2432-6380

Volume 118, Number 236

Biometrics

Workshop Date : 2018-10-11 - 2018-10-12 / Issue Date : 2018-10-04

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Table of contents

BioX2018-19
A Study on Efficiency Improvement of Multi-Stage Narrowing Down Process for Large Scale 1:N Biometric Identification
Takahiro Aoki (Fujitsu Labs)
pp. 1 - 6

BioX2018-20
Consideration of Quality Improvement for Neonate-Fingerprint Images
Yoshinori Koda, Koichi Ito, Takafumi Aoki (Tohoku Univ)
pp. 7 - 12

BioX2018-21
Clothing-invariant human shape estimation and its application for person recognition
Yui Shigeki, Fumio Okura, Mohamed Hasan (Osaka Univ.), Ikuhisa MItsugami (Hiroshima City Univ.), Yasushi Yagi (Osaka Univ.)
pp. 13 - 18

BioX2018-22
On Information Gained from Pseudonymized Location Traces
Takao Murakami (AIST)
pp. 19 - 23

BioX2018-23
On the Security and Efficiency of Template Protected Biometric Identification (Part 2)
Wataru Nakamura, Yosuke Kaga, Masakazu Fujio, Kenta Takahashi (Hitachi)
pp. 25 - 30

BioX2018-24
[Invited Talk] Biometric Data Sensing by Themal Information
Kazuhito Murakami (APU)
pp. 31 - 32

BioX2018-25
Extraction of gait information and authentication by an infrared sensor network
Shumpei Tsubakino, Mineichi Kudo (Hokkaido Univ.)
pp. 33 - 38

BioX2018-26
On Gait-based Age and Health Age
Atsuya Sakata, Hirofumi Nishikawa, Noriko Takemura, Yasushi Makihara, Daigo Muramatsu, Yasushi Yagi (Osaka Univ.)
pp. 39 - 44

BioX2018-27
Evaluation for individuality of intermediate output from CNN-based gait classification network
Kousuke Moriwaki, Daigo Muramatsu, Noriko Takemura, Yasushi Yagi (Osaka Univ.)
pp. 45 - 49

BioX2018-28
[Invited Talk] Company strategy and future plan on customer identification and customer authentication using smartphone application
Masanori Kimura (DNP)
pp. 51 - 53

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan