IEICE Technical Report

Online edition: ISSN 2432-6380

Volume 122, Number 79

Reliability

Workshop Date : 2022-06-16 / Issue Date : 2022-06-09

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Table of contents

R2022-6
Study on cause analysis method for tool to tool matching management for CD-SEM
Naoya Tanahashi, Shintaro Takada (Hitachi)
pp. 1 - 6

R2022-7
Applying Bandit Algorithm toward Software Review Optimization
Takuto Kudo, Masateru Tsunoda (Kindai Univ.), Keitaro Nakasai (NIT, Kagoshima College)
pp. 7 - 12

R2022-8
A Note on Interval Reliability Analysis of Intrusion Tolerant Systems Subject to DoS Attacks
Junjun Zheng (Ritsumeikan Univ.), Hiroyuki Okamura, Tadashi Dohi (Hiroshima Univ.)
pp. 13 - 18

Note: Each article is a technical report without peer review, and its polished version will be published elsewhere.


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan