Paper Abstract and Keywords |
Presentation |
2005-01-28 14:50
A Fine Phase Measurement Method of Low frequency analog signals on Various Audio Amplifiers Shingo Yasuda (JAIST), Shin-ichi Nakagawa (JAIST/NICT), Jun Inoue (NICT), Minoru Mitsui, Tomoharu Ishikawa, Makoto Miyahara (JAIST) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
To improve the quality of hearing for those with hearing loss in the high frequency range, we have researched the
low frequency signals of audio amplifiers. we examined the new measuring method of audio signals with high bit sampling
method. As the result, the detecting limit of phase shift turned out to be 10 micro second, 0.2 degree. In addition, a
theoretically analyzed amplifier with time index of DC-cutting circuit was tested with change the capacity of condenser in RC
circuit for time constant. As the result, the rotation value correlated with the capacity of the condensers. The same method was
used on several amplifiers. As the result the phase shift of these amplifiers was approximately 0.6 degree to 15 degree under
250Hz. The gaps Asymptotic with increasing the frequency of the signals and cannot be detected at the 250 Hz. This the phase
characteristic measuring method of a low frequency range is compared with measurement by the Steady State Response mode
of Bruel&Kjaer Type 2012. It has the advantage which can be measured in accuracy of the same grade simple. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
Time constant / Group Delay / Phase characteristic / / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 104, no. 615, EA2004-133, pp. 51-56, Jan. 2005. |
Paper # |
EA2004-133 |
Date of Issue |
2005-01-21 (EA) |
ISSN |
Print edition: ISSN 0913-5685 |
Download PDF |
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Conference Information |
Committee |
EA |
Conference Date |
2005-01-27 - 2005-01-28 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Kansai Univ. |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Active Noise Control, Echo Canceler, Noise Canceler, etc. |
Paper Information |
Registration To |
EA |
Conference Code |
2005-01-EA |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Fine Phase Measurement Method of Low frequency analog signals on Various Audio Amplifiers |
Sub Title (in English) |
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Keyword(1) |
Time constant |
Keyword(2) |
Group Delay |
Keyword(3) |
Phase characteristic |
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1st Author's Name |
Shingo Yasuda |
1st Author's Affiliation |
Japan Advanced Institute of Science and Technology (JAIST) |
2nd Author's Name |
Shin-ichi Nakagawa |
2nd Author's Affiliation |
JAIST/NICT (JAIST/NICT) |
3rd Author's Name |
Jun Inoue |
3rd Author's Affiliation |
NICT (NICT) |
4th Author's Name |
Minoru Mitsui |
4th Author's Affiliation |
Japan Advanced Institute of Science and Technology (JAIST) |
5th Author's Name |
Tomoharu Ishikawa |
5th Author's Affiliation |
Japan Advanced Institute of Science and Technology (JAIST) |
6th Author's Name |
Makoto Miyahara |
6th Author's Affiliation |
Japan Advanced Institute of Science and Technology (JAIST) |
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Speaker |
Author-1 |
Date Time |
2005-01-28 14:50:00 |
Presentation Time |
30 minutes |
Registration for |
EA |
Paper # |
EA2004-133 |
Volume (vol) |
vol.104 |
Number (no) |
no.615 |
Page |
pp.51-56 |
#Pages |
6 |
Date of Issue |
2005-01-21 (EA) |
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