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Paper Abstract and Keywords
Presentation 2005-01-28 14:50
A Fine Phase Measurement Method of Low frequency analog signals on Various Audio Amplifiers
Shingo Yasuda (JAIST), Shin-ichi Nakagawa (JAIST/NICT), Jun Inoue (NICT), Minoru Mitsui, Tomoharu Ishikawa, Makoto Miyahara (JAIST)
Abstract (in Japanese) (See Japanese page) 
(in English) To improve the quality of hearing for those with hearing loss in the high frequency range, we have researched the
low frequency signals of audio amplifiers. we examined the new measuring method of audio signals with high bit sampling
method. As the result, the detecting limit of phase shift turned out to be 10 micro second, 0.2 degree. In addition, a
theoretically analyzed amplifier with time index of DC-cutting circuit was tested with change the capacity of condenser in RC
circuit for time constant. As the result, the rotation value correlated with the capacity of the condensers. The same method was
used on several amplifiers. As the result the phase shift of these amplifiers was approximately 0.6 degree to 15 degree under
250Hz. The gaps Asymptotic with increasing the frequency of the signals and cannot be detected at the 250 Hz. This the phase
characteristic measuring method of a low frequency range is compared with measurement by the Steady State Response mode
of Bruel&Kjaer Type 2012. It has the advantage which can be measured in accuracy of the same grade simple.
Keyword (in Japanese) (See Japanese page) 
(in English) Time constant / Group Delay / Phase characteristic / / / / /  
Reference Info. IEICE Tech. Rep., vol. 104, no. 615, EA2004-133, pp. 51-56, Jan. 2005.
Paper # EA2004-133 
Date of Issue 2005-01-21 (EA) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee EA  
Conference Date 2005-01-27 - 2005-01-28 
Place (in Japanese) (See Japanese page) 
Place (in English) Kansai Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Active Noise Control, Echo Canceler, Noise Canceler, etc. 
Paper Information
Registration To EA 
Conference Code 2005-01-EA 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A Fine Phase Measurement Method of Low frequency analog signals on Various Audio Amplifiers 
Sub Title (in English)  
Keyword(1) Time constant  
Keyword(2) Group Delay  
Keyword(3) Phase characteristic  
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1st Author's Name Shingo Yasuda  
1st Author's Affiliation Japan Advanced Institute of Science and Technology (JAIST)
2nd Author's Name Shin-ichi Nakagawa  
2nd Author's Affiliation JAIST/NICT (JAIST/NICT)
3rd Author's Name Jun Inoue  
3rd Author's Affiliation NICT (NICT)
4th Author's Name Minoru Mitsui  
4th Author's Affiliation Japan Advanced Institute of Science and Technology (JAIST)
5th Author's Name Tomoharu Ishikawa  
5th Author's Affiliation Japan Advanced Institute of Science and Technology (JAIST)
6th Author's Name Makoto Miyahara  
6th Author's Affiliation Japan Advanced Institute of Science and Technology (JAIST)
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Speaker Author-1 
Date Time 2005-01-28 14:50:00 
Presentation Time 30 minutes 
Registration for EA 
Paper # EA2004-133 
Volume (vol) vol.104 
Number (no) no.615 
Page pp.51-56 
#Pages
Date of Issue 2005-01-21 (EA) 


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