Paper Abstract and Keywords |
Presentation |
2005-06-28 11:15
A Scale Estimation Algorithm Based on Phase-Only Correlation for Electron Microscope Images Sei Nagashima, Takafumi Aoki (Tohoku Univ.), Ruriko Tsuneta (Hitachi, Ltd., Central Reserch Laboratry) |
Abstract |
(in Japanese) |
(See Japanese page) |
(in English) |
This paper presents a scale estimation algorithm based on Phase-Only Correlation (POC) for electron microscope images. The proposed method can estimate the scale factor and translational displacements between a
reference image and an input image with high-accuracy. Significant improvement in scale estimation performance can be achieved by extracting a common region between the reference image and input image. Experimental evaluation using the Mandelbrot picture as a precisely scale-controlled image shows that the proposed method can estimate the scale factor in approximately 0.2[%]-scale accuracy, where the image size is 401x401[pixel], the scale factor is about 1000 and the scale is estimated with 16 stages (thus, the scale factor of each stage is about 1.54). This paper
also describes an application of the proposed algorithm to magnification calibration for electron microscope images. |
Keyword |
(in Japanese) |
(See Japanese page) |
(in English) |
phase-only correlation / scale estimation / mandelbrot picture / electron microscope / / / / |
Reference Info. |
IEICE Tech. Rep., vol. 105, no. 150, SIP2005-42, pp. 19-24, June 2005. |
Paper # |
SIP2005-42 |
Date of Issue |
2005-06-21 (CAS, VLD, SIP) |
ISSN |
Print edition: ISSN 0913-5685 |
Download PDF |
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Conference Information |
Committee |
CAS SIP VLD |
Conference Date |
2005-06-27 - 2005-06-28 |
Place (in Japanese) |
(See Japanese page) |
Place (in English) |
Tohoku University |
Topics (in Japanese) |
(See Japanese page) |
Topics (in English) |
Signal Processing, LSI, etc. |
Paper Information |
Registration To |
SIP |
Conference Code |
2005-06-CAS-SIP-VLD |
Language |
Japanese |
Title (in Japanese) |
(See Japanese page) |
Sub Title (in Japanese) |
(See Japanese page) |
Title (in English) |
A Scale Estimation Algorithm Based on Phase-Only Correlation for Electron Microscope Images |
Sub Title (in English) |
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Keyword(1) |
phase-only correlation |
Keyword(2) |
scale estimation |
Keyword(3) |
mandelbrot picture |
Keyword(4) |
electron microscope |
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1st Author's Name |
Sei Nagashima |
1st Author's Affiliation |
Tohoku University (Tohoku Univ.) |
2nd Author's Name |
Takafumi Aoki |
2nd Author's Affiliation |
Tohoku University (Tohoku Univ.) |
3rd Author's Name |
Ruriko Tsuneta |
3rd Author's Affiliation |
Hitachi, Ltd., Central Reserch Laboratry (Hitachi, Ltd., Central Reserch Laboratry) |
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Speaker |
Author-1 |
Date Time |
2005-06-28 11:15:00 |
Presentation Time |
25 minutes |
Registration for |
SIP |
Paper # |
CAS2005-18, VLD2005-29, SIP2005-42 |
Volume (vol) |
vol.105 |
Number (no) |
no.146(CAS), no.148(VLD), no.150(SIP) |
Page |
pp.19-24 |
#Pages |
6 |
Date of Issue |
2005-06-21 (CAS, VLD, SIP) |
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