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Paper Abstract and Keywords
Presentation 2005-09-15 15:00
Modeling the Effective Capacitance of Interconnect Loads for Predicting CMOS Gate Slew
Zhangcai Huang (Waseda Univ.), Atsushi Kurukawa (STAC), Yasuaki Inoue (Waseda Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) In deep submicron designs, predicting
gate slews and delays for interconnect loads is vitally
important for Static Timing Analysis (STA). The effective capacitance Ceff concept is usually used to calculate the gate delay of interconnect loads. Many Ceff algorithms have been proposed to compute gate delay
of interconnect loads. However, less work has been
done to develop a Ceff algorithm which can accurately
predict gate slew. In this paper, we propose a novel
method for calculating the Ceff of interconnect load
for gate slew. The simulation results demonstrate a
significant improvement in accuracy.
Keyword (in Japanese) (See Japanese page) 
(in English) Static Timing Analysis / gate slew / interconnect load / effective capacitance / / / /  
Reference Info. IEICE Tech. Rep., vol. 105, no. 276, NLP2005-44, pp. 31-36, Sept. 2005.
Paper # NLP2005-44 
Date of Issue 2005-09-08 (CAS, NLP) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee CAS NLP  
Conference Date 2005-09-15 - 2005-09-16 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagaoka Univ. of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) general 
Paper Information
Registration To NLP 
Conference Code 2005-09-CAS-NLP 
Language English 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Modeling the Effective Capacitance of Interconnect Loads for Predicting CMOS Gate Slew 
Sub Title (in English)  
Keyword(1) Static Timing Analysis  
Keyword(2) gate slew  
Keyword(3) interconnect load  
Keyword(4) effective capacitance  
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1st Author's Name Zhangcai Huang  
1st Author's Affiliation Waseda University (Waseda Univ.)
2nd Author's Name Atsushi Kurukawa  
2nd Author's Affiliation The Semiconductor Technology Academic Research Center (STAC)
3rd Author's Name Yasuaki Inoue  
3rd Author's Affiliation Waseda University (Waseda Univ.)
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Speaker Author-1 
Date Time 2005-09-15 15:00:00 
Presentation Time 25 minutes 
Registration for NLP 
Paper # CAS2005-31, NLP2005-44 
Volume (vol) vol.105 
Number (no) no.274(CAS), no.276(NLP) 
Page pp.31-36 
#Pages
Date of Issue 2005-09-08 (CAS, NLP) 


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