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Paper Abstract and Keywords
Presentation 2006-07-06 14:10
Nondestructive Inspection Technology Using HTS SQUID
Yoshimi Hatsukade, , Saburo Tanaka (Toyohashi Univ. of Tech,) Link to ES Tech. Rep. Archives: SCE2006-21
Abstract (in Japanese) (See Japanese page) 
(in English) It is difficult by the conventional nondestructive evaluation (NDE) methods to detect recently reported very shallow flaws with less than 50 micron-meter depth on thin copper tubes, or small through holes of less than 0.5 mm in diameter in aluminum flat tubes. Taking advantage of the uncontested high sensitivity of HTS SQUIDs among magnetic sensors, detection of above-mentioned small defects was demonstrated using a newly developed HTS-SQUID NDE system for metallic tubes. So far, a small defect, which volume is about a bit less than 10^7 micron-meter^3, has been successfully detected by the system. With improvement on system noise level, reduction of lift-off distance, and enhancement of excitation field or injected current, it is supposed that the minimum detectable size of a defect could be easily reduced to about 10^6 micron-meter^3.
Keyword (in Japanese) (See Japanese page) 
(in English) HTS SQUID / Nondestructive Evaluation / Metallic Tubes / Flaw Detection / Gradiometer / Unshielded / Cryocooler /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 139, SCE2006-21, pp. 47-52, July 2006.
Paper # SCE2006-21 
Date of Issue 2006-06-29 (SCE) 
ISSN Print edition: ISSN 0913-5685
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: SCE2006-21

Conference Information
Committee SCE  
Conference Date 2006-07-06 - 2006-07-06 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) SQUID, etc. 
Paper Information
Registration To SCE 
Conference Code 2006-07-SCE 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Nondestructive Inspection Technology Using HTS SQUID 
Sub Title (in English)
Keyword(1) HTS SQUID  
Keyword(2) Nondestructive Evaluation  
Keyword(3) Metallic Tubes  
Keyword(4) Flaw Detection  
Keyword(5) Gradiometer  
Keyword(6) Unshielded  
Keyword(7) Cryocooler  
Keyword(8)  
1st Author's Name Yoshimi Hatsukade  
1st Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech,)
2nd Author's Name *  
2nd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech,)
3rd Author's Name Saburo Tanaka  
3rd Author's Affiliation Toyohashi University of Technology (Toyohashi Univ. of Tech,)
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Speaker Author-1 
Date Time 2006-07-06 14:10:00 
Presentation Time 25 minutes 
Registration for SCE 
Paper # SCE2006-21 
Volume (vol) vol.106 
Number (no) no.139 
Page pp.47-52 
#Pages
Date of Issue 2006-06-29 (SCE) 


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