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Paper Abstract and Keywords
Presentation 2006-07-28 12:00
High frequency magnetic imaging with a high sensitivity integrated magnetic probe
Satoshi Aoyama, Shoji Kawahito (Shizuoka Univ.), Masahiro Yamaguchi (Tohoku Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) A novel magnetic probe has been designed and fabricated in a 0.15 $\mu m$ five-metal CMOS-SOI technology, in order to achieve both high sensitivity and high spatial resolution.
A detecting coil, a 2-stage differential amplifier, a differential to single-ended converter, an output buffer and other peripheral circuits are all integrated on a single chip. The probe has a feature to distinguish magnetic field from the detected electromagnetic emissions, by means of a 2-turn differential coil structure and a circuit technique of a wideband differential-to-single-ended converter with the high common mode rejection.
A 2D magnetic distribution map has been drawn by the fabricated active probe, and the obtained image is finer than that of a shielded loop coil. Furthermore, the concurrent measurement of the magnetic field with three aligned minute active probes has been demonstrated using electrical switching.
Keyword (in Japanese) (See Japanese page) 
(in English) Magnetic Probe / Active Probe / Array / Near Field Measurement / CMOS-SOI / EMC / EMI /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 189, ICD2006-72, pp. 67-72, July 2006.
Paper # ICD2006-72 
Date of Issue 2006-07-20 (ICD) 
ISSN Print edition: ISSN 0913-5685
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Conference Information
Committee ICD ITE-IST  
Conference Date 2006-07-27 - 2006-07-28 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ICD 
Conference Code 2006-07-ICD-ITE-IST 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) High frequency magnetic imaging with a high sensitivity integrated magnetic probe 
Sub Title (in English)  
Keyword(1) Magnetic Probe  
Keyword(2) Active Probe  
Keyword(3) Array  
Keyword(4) Near Field Measurement  
Keyword(5) CMOS-SOI  
Keyword(6) EMC  
Keyword(7) EMI  
Keyword(8)  
1st Author's Name Satoshi Aoyama  
1st Author's Affiliation Shizuoka University (Shizuoka Univ.)
2nd Author's Name Shoji Kawahito  
2nd Author's Affiliation Shizuoka University (Shizuoka Univ.)
3rd Author's Name Masahiro Yamaguchi  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
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Speaker Author-1 
Date Time 2006-07-28 12:00:00 
Presentation Time 30 minutes 
Registration for ICD 
Paper # ICD2006-72 
Volume (vol) vol.106 
Number (no) no.189 
Page pp.67-72 
#Pages
Date of Issue 2006-07-20 (ICD) 


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