Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2006-08-04 11:00
An Efficient Model Checking Method for Programs with History-based Access Control
Jing Wang, Yoshiaki Takata, Hiroyuki Seki (NAIST)
Abstract (in Japanese) (See Japanese page) 
(in English) 我々は、実行履歴に基づくアクセス制御を含む再帰プログラムの形式モデルHBACプログラムを提案し、HBACプログラムのモデル検査法について考察してきた。本発表では、提案するモデル検査法におけるいくつかの最適化手法を述べる。また、実装した検証ツールを用いた検証実験に基づき、これらの最適化の効果について議論する。
Keyword (in Japanese) (See Japanese page) 
(in English) history-based access control / verification / model checking / security / context-free grammar / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 202, SS2006-38, pp. 23-28, Aug. 2006.
Paper # SS2006-38 
Date of Issue 2006-07-28 (SS) 
ISSN Print edition: ISSN 0913-5685
Download PDF

Conference Information
Committee SS  
Conference Date 2006-08-03 - 2006-08-04 
Place (in Japanese) (See Japanese page) 
Place (in English) Hokkaido University 
Topics (in Japanese) (See Japanese page) 
Topics (in English) general 
Paper Information
Registration To SS 
Conference Code 2006-08-SS 
Language English (Japanese title is available) 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) An Efficient Model Checking Method for Programs with History-based Access Control 
Sub Title (in English)  
Keyword(1) history-based access control  
Keyword(2) verification  
Keyword(3) model checking  
Keyword(4) security  
Keyword(5) context-free grammar  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Jing Wang  
1st Author's Affiliation Nara Institute of Science and Technology (NAIST)
2nd Author's Name Yoshiaki Takata  
2nd Author's Affiliation Nara Institute of Science and Technology (NAIST)
3rd Author's Name Hiroyuki Seki  
3rd Author's Affiliation Nara Institute of Science and Technology (NAIST)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2006-08-04 11:00:00 
Presentation Time 30 minutes 
Registration for SS 
Paper # SS2006-38 
Volume (vol) vol.106 
Number (no) no.202 
Page pp.23-28 
#Pages
Date of Issue 2006-07-28 (SS) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan