Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information		 Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2006-12-15 11:20
Reducing False Positive and Observation Cost in Bandwidth Usage-based Pulsing DoS Detection Schemes
Kenjiro Arai, Hiroshi Tsunoda, Yuji Waizumi, Yoshiaki Nemoto (Tohoku Univ.) CS2006-62 IE2006-130
Abstract (in Japanese) (See Japanese page) 
(in English) Pulsing Denial-of-Service (PDoS) attacks seriously degrade the
throughput of TCP flow and consequently pose a grave concern to networks.
The fact that they generate less traffic than traditional flood-based
attacks makes PDoS detection more difficult.
Although most of the conventional PDoS detection schemes observe the
periodical pattern of the pulse trains, attackers can easily evade the
detection system by merely controlling the timing of pulse
transmission.
The bandwidth usage-based detection scheme, which the authors
previously proposed, is robust to the control of attack traffic
by attackers.
However, the conventional method needs high observation cost because
the flow-based traffic analysis is required for reducing false
positives.
In this paper, we propose a new bandwidth usage-based detection
method taking into account the burstiness of traffic which is the
principal feature of PDoS attacks.
The proposed method can drastically decrease the number of false
positives without complicated flow-based traffic analysis.
Since the proposed method monitors only aggregated flows, the
observation cost is also reduced as compared with the conventional
method.
Through various simulations, we demonstrate the effectiveness of the
proposed method.
Keyword (in Japanese) (See Japanese page) 
(in English) Pulsing Denial-of-Service Attacks / Detection / Bandwidth Usage Condition / Burstiness of Traffic / / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 422, CS2006-62, pp. 25-30, Dec. 2006.
Paper # CS2006-62 
Date of Issue 2006-12-08 (CS, IE) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF CS2006-62 IE2006-130

Conference Information
Committee CS IE ITE-BCT IPSJ-AVM  
Conference Date 2006-12-14 - 2006-12-15 
Place (in Japanese) (See Japanese page) 
Place (in English) Nagoya Univ. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Image coding, Communications and Stream Technologies, etc. 
Paper Information
Registration To CS 
Conference Code 2006-12-CS-IE-ITE-BCT-IPSJ-AVM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Reducing False Positive and Observation Cost in Bandwidth Usage-based Pulsing DoS Detection Schemes 
Sub Title (in English)  
Keyword(1) Pulsing Denial-of-Service Attacks  
Keyword(2) Detection  
Keyword(3) Bandwidth Usage Condition  
Keyword(4) Burstiness of Traffic  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Kenjiro Arai  
1st Author's Affiliation Tohoku University (Tohoku Univ.)
2nd Author's Name Hiroshi Tsunoda  
2nd Author's Affiliation Tohoku University (Tohoku Univ.)
3rd Author's Name Yuji Waizumi  
3rd Author's Affiliation Tohoku University (Tohoku Univ.)
4th Author's Name Yoshiaki Nemoto  
4th Author's Affiliation Tohoku University (Tohoku Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2006-12-15 11:20:00 
Presentation Time 25 minutes 
Registration for CS 
Paper # CS2006-62, IE2006-130 
Volume (vol) vol.106 
Number (no) no.422(CS), no.424(IE) 
Page pp.25-30 
#Pages 6 
Date of Issue 2006-12-08 (CS, IE) 

[Return to Top Page]

[Return to IEICE Web Page]
The Institute of Electronics, Information and Communication Engineers (IEICE), Japan