Information: Join today and make your research activities more affordable! Technical workshop participation fees and annual registration fees are available at member rates.
Notice: [Important] Announcement of Changes to Registration Fee Payment and Manuscript Upload Procedures for IEICE Technical Meetings
IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-01-18 09:50
Measurement of Delay Variation Due to Inductive Coupling Noise in 90nm Global Interconnects
Yasuhiro Ogasahara, Masanori Hashimoto, Takao Onoye (Osaka Univ.)
Abstract (in Japanese) (See Japanese page) 
(in English) Inductive coupling is becoming a design concern for global interconnects in nano-meter technologies. This paper shows measurement results of inductive coupling effect on timing, and reveals that inductive coupling noise is a practical design issue in a 90nm technology. The measured delay change curve is consistent with circuit simulation results with RLC interconnect model, and definitely different from those of conventional RC model. Long-range effect and noise reduction by ground insertion are clearly observed on silicon.
Keyword (in Japanese) (See Japanese page) 
(in English) signal integrity / inductive crosstalk noise / interconnect delay / interconnect modeling / / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 468, ICD2006-173, pp. 13-18, Jan. 2007.
Paper # ICD2006-173 
Date of Issue 2007-01-11 (CPM, ICD) 
ISSN Print edition: ISSN 0913-5685
Download PDF

Conference Information
Committee ICD CPM  
Conference Date 2007-01-18 - 2007-01-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kika-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English) LSI system assembly and module/inteface technology, test, general 
Paper Information
Registration To ICD 
Conference Code 2007-01-ICD-CPM 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Measurement of Delay Variation Due to Inductive Coupling Noise in 90nm Global Interconnects 
Sub Title (in English)  
Keyword(1) signal integrity  
Keyword(2) inductive crosstalk noise  
Keyword(3) interconnect delay  
Keyword(4) interconnect modeling  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yasuhiro Ogasahara  
1st Author's Affiliation Osaka University (Osaka Univ.)
2nd Author's Name Masanori Hashimoto  
2nd Author's Affiliation Osaka University (Osaka Univ.)
3rd Author's Name Takao Onoye  
3rd Author's Affiliation Osaka University (Osaka Univ.)
4th Author's Name  
4th Author's Affiliation ()
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
21st Author's Name  
21st Author's Affiliation ()
22nd Author's Name  
22nd Author's Affiliation ()
23rd Author's Name  
23rd Author's Affiliation ()
24th Author's Name  
24th Author's Affiliation ()
25th Author's Name  
25th Author's Affiliation ()
26th Author's Name / /
26th Author's Affiliation ()
()
27th Author's Name / /
27th Author's Affiliation ()
()
28th Author's Name / /
28th Author's Affiliation ()
()
29th Author's Name / /
29th Author's Affiliation ()
()
30th Author's Name / /
30th Author's Affiliation ()
()
31st Author's Name / /
31st Author's Affiliation ()
()
32nd Author's Name / /
32nd Author's Affiliation ()
()
33rd Author's Name / /
33rd Author's Affiliation ()
()
34th Author's Name / /
34th Author's Affiliation ()
()
35th Author's Name / /
35th Author's Affiliation ()
()
36th Author's Name / /
36th Author's Affiliation ()
()
Speaker Author-1 
Date Time 2007-01-18 09:50:00 
Presentation Time 25 minutes 
Registration for ICD 
Paper # CPM2006-131, ICD2006-173 
Volume (vol) vol.106 
Number (no) no.467(CPM), no.468(ICD) 
Page pp.13-18 
#Pages
Date of Issue 2007-01-11 (CPM, ICD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan