IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-01-18 14:50
A study on material measurement methods using FDTD simulation techniques -- Measurements of surface resistance of metals and dielectric plates including semiconductor wafer in millimeter-wave range --
Yukio Iida, Koichi Nakao, Yasuhisa Omura, Susumu Tamura (Kansai Univ.) Link to ES Tech. Rep. Archives: ED2006-221 MW2006-174
Abstract (in Japanese) (See Japanese page) 
(in English) (Not available yet)
Keyword (in Japanese) (See Japanese page) 
(in English) / / / / / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 460, MW2006-174, pp. 115-120, Jan. 2007.
Paper # MW2006-174 
Date of Issue 2007-01-10 (ED, MW) 
ISSN Print edition: ISSN 0913-5685
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: ED2006-221 MW2006-174

Conference Information
Committee MW ED  
Conference Date 2007-01-17 - 2007-01-19 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To MW 
Conference Code 2007-01-MW-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) A study on material measurement methods using FDTD simulation techniques 
Sub Title (in English) Measurements of surface resistance of metals and dielectric plates including semiconductor wafer in millimeter-wave range 
Keyword(1)  
Keyword(2)  
Keyword(3)  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Yukio Iida  
1st Author's Affiliation Kansai University (Kansai Univ.)
2nd Author's Name Koichi Nakao  
2nd Author's Affiliation Kansai University (Kansai Univ.)
3rd Author's Name Yasuhisa Omura  
3rd Author's Affiliation Kansai University (Kansai Univ.)
4th Author's Name Susumu Tamura  
4th Author's Affiliation Kansai University (Kansai Univ.)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2007-01-18 14:50:00 
Presentation Time 25 minutes 
Registration for MW 
Paper # ED2006-221, MW2006-174 
Volume (vol) vol.106 
Number (no) no.459(ED), no.460(MW) 
Page pp.115-120 
#Pages
Date of Issue 2007-01-10 (ED, MW) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan