IEICE Technical Committee Submission System
Conference Paper's Information
Online Proceedings
[Sign in]
Tech. Rep. Archives
 Go Top Page Go Previous   [Japanese] / [English] 

Paper Abstract and Keywords
Presentation 2007-03-07 16:40
Equivalent Circuit Modeling of Guard Ring Structures for Evaluation of Substrate Crosstalk Isolation
Daisuke Kosaka, Makoto Nagata (Kobe Univ.), Yoshitaka Murasaka, Atsushi Iwata (A-R-Tec) Link to ES Tech. Rep. Archives: ICD2006-206
Abstract (in Japanese) (See Japanese page) 
(in English) A substrate-coupling equivalent circuit can be derived for an arbitrary
guard ring test structure by way of F-matrix computation. The derived netlist represents a unified impedance network among multiple sites on a chip surface and allows circuit simulation to evaluate of isolation effects provided by guard rings. Geometry dependency of guard ring effects attributes to layout patterns of a test structure, including such as area of a guard ring as well as location distance from the circuit to be isolated by the guard ring. In addition, structural dependency arises from vertical impurity concentrations such as p$^{+}$, n$^{+}$, and deep n-well, which are generally available in a deep-submicron CMOS technology.
The proposed simulation based prototyping technique of guard ring structures can include all these dependences and thus can be strongly helpful to establish isolation strategy against substrate coupling in a given technology, in an early stage of SoC developments.
Keyword (in Japanese) (See Japanese page) 
(in English) substrate crosstalk / deep n-well / F-matrix computation / / / / /  
Reference Info. IEICE Tech. Rep., vol. 106, no. 550, ICD2006-206, pp. 55-60, March 2007.
Paper # ICD2006-206 
Date of Issue 2007-02-28 (VLD, ICD) 
ISSN Print edition: ISSN 0913-5685
Copyright
and
reproduction
All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF Link to ES Tech. Rep. Archives: ICD2006-206

Conference Information
Committee ICD VLD  
Conference Date 2007-03-07 - 2007-03-09 
Place (in Japanese) (See Japanese page) 
Place (in English) Mielparque Okinawa 
Topics (in Japanese) (See Japanese page) 
Topics (in English) System-on-silicon design techniques and related VLSs 
Paper Information
Registration To ICD 
Conference Code 2007-03-ICD-VLD 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Equivalent Circuit Modeling of Guard Ring Structures for Evaluation of Substrate Crosstalk Isolation 
Sub Title (in English)  
Keyword(1) substrate crosstalk  
Keyword(2) deep n-well  
Keyword(3) F-matrix computation  
Keyword(4)  
Keyword(5)  
Keyword(6)  
Keyword(7)  
Keyword(8)  
1st Author's Name Daisuke Kosaka  
1st Author's Affiliation Kobe University (Kobe Univ.)
2nd Author's Name Makoto Nagata  
2nd Author's Affiliation Kobe University (Kobe Univ.)
3rd Author's Name Yoshitaka Murasaka  
3rd Author's Affiliation A-R-Tec Corporation (A-R-Tec)
4th Author's Name Atsushi Iwata  
4th Author's Affiliation A-R-Tec Corporation (A-R-Tec)
5th Author's Name  
5th Author's Affiliation ()
6th Author's Name  
6th Author's Affiliation ()
7th Author's Name  
7th Author's Affiliation ()
8th Author's Name  
8th Author's Affiliation ()
9th Author's Name  
9th Author's Affiliation ()
10th Author's Name  
10th Author's Affiliation ()
11th Author's Name  
11th Author's Affiliation ()
12th Author's Name  
12th Author's Affiliation ()
13th Author's Name  
13th Author's Affiliation ()
14th Author's Name  
14th Author's Affiliation ()
15th Author's Name  
15th Author's Affiliation ()
16th Author's Name  
16th Author's Affiliation ()
17th Author's Name  
17th Author's Affiliation ()
18th Author's Name  
18th Author's Affiliation ()
19th Author's Name  
19th Author's Affiliation ()
20th Author's Name  
20th Author's Affiliation ()
Speaker Author-1 
Date Time 2007-03-07 16:40:00 
Presentation Time 20 minutes 
Registration for ICD 
Paper # VLD2006-115, ICD2006-206 
Volume (vol) vol.106 
Number (no) no.547(VLD), no.550(ICD) 
Page pp.55-60 
#Pages
Date of Issue 2007-02-28 (VLD, ICD) 


[Return to Top Page]

[Return to IEICE Web Page]


The Institute of Electronics, Information and Communication Engineers (IEICE), Japan