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Paper Abstract and Keywords
Presentation 2007-04-20 15:25
Characterization of carrier transport of single crystal rubrene by TOF and four point measurement
Heng Shim Teh, Fumihiko Hirose (Yamagata Univ.), Yasuo Kimura, Michio Niwano (Tohoku Univ. RIEC), Kingo Itaya (Tohoku Univ.) ED2007-6 SDM2007-6 OME2007-6
Abstract (in Japanese) (See Japanese page) 
(in English) We have developed a time-of-flight (TOF) measurement system to evaluate lateral charge carrier transport in organic semiconductor films. In our system we used a rod or rectangular film as the sample with a length of 1-2mm with both the ends contacted to electrodes to apply a DC electric field in the sample where the side surface of the sample is fixed to a thin glass plate with a slit. The slit is used to define the UV irradiated area in the sample. We have found that it is possible to obtain lateral TOFs of electron and hole simultaneously by adjusting the UV irradiated area at a certain distance to the end of the electrode. In the present paper, we describe the details of the system and a TOF measurement with a rubrene single crystal as an example, which attracts much attention due to its high hole mobility in excess of 10cm2/Vs.
Keyword (in Japanese) (See Japanese page) 
(in English) TOF / mobility / organic / semiconductor / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 13, ED2007-6, pp. 29-31, April 2007.
Paper # ED2007-6 
Date of Issue 2007-04-13 (ED, SDM, OME) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee OME SDM ED  
Conference Date 2007-04-20 - 2007-04-20 
Place (in Japanese) (See Japanese page) 
Place (in English)  
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ED 
Conference Code 2007-04-OME-SDM-ED 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Characterization of carrier transport of single crystal rubrene by TOF and four point measurement 
Sub Title (in English)  
Keyword(1) TOF  
Keyword(2) mobility  
Keyword(3) organic  
Keyword(4) semiconductor  
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1st Author's Name Heng Shim Teh  
1st Author's Affiliation Yamagata University Graduate School of Science and Engineering (Yamagata Univ.)
2nd Author's Name Fumihiko Hirose  
2nd Author's Affiliation Yamagata University Graduate School of Science and Engineering (Yamagata Univ.)
3rd Author's Name Yasuo Kimura  
3rd Author's Affiliation Tohoku University RIEC (Tohoku Univ. RIEC)
4th Author's Name Michio Niwano  
4th Author's Affiliation Tohoku University RIEC (Tohoku Univ. RIEC)
5th Author's Name Kingo Itaya  
5th Author's Affiliation Tohoku University, Graduate school of engineering (Tohoku Univ.)
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Speaker Author-1 
Date Time 2007-04-20 15:25:00 
Presentation Time 25 minutes 
Registration for ED 
Paper # ED2007-6, SDM2007-6, OME2007-6 
Volume (vol) vol.107 
Number (no) no.13(ED), no.14(SDM), no.15(OME) 
Page pp.29-31 
#Pages 3 
Date of Issue 2007-04-13 (ED, SDM, OME) 

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