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Paper Abstract and Keywords
Presentation 2007-05-18 10:35
Correction of "Test for the Longest Run of Ones in a Block" Included in NIST Randomness Test Suite
Kenji Hamano (The Univ. of Tokyo) ISEC2007-3
Abstract (in Japanese) (See Japanese page) 
(in English) When random sequences taken from the block cipher DES, which is known to be a good random generator, were tested using “test for the longest run of ones in a block” included in NIST randomness test suite (NIST SP800-22), we have observed that the null hypothesis that the given sequences seem to be random was rejected. In this report, we show that occurrence probabilities of the longest run of ones in a block used in the NIST randomness test suite are approximate values. Next, we point out that sequence length 1Mbits, which is widely used sequence length for randomness testing, should not be used for accurate randomness testing. When the occurrence probabilities used in the NIST randomness test suite were replaced by our new correct values shown in this report and sequence length was set to longer than 4Mbits, random sequences taken from DES became to pass the test. The same result was obtained when the block cipher AES was used instead of DES as a random number generator.
Keyword (in Japanese) (See Japanese page) 
(in English) Test for the Longest Run of Ones in a Block / randomness test / NIST SP800-22 / / / / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 44, ISEC2007-3, pp. 17-21, May 2007.
Paper # ISEC2007-3 
Date of Issue 2007-05-11 (ISEC) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
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Conference Information
Committee ISEC  
Conference Date 2007-05-18 - 2007-05-18 
Place (in Japanese) (See Japanese page) 
Place (in English) Kikai-Shinko-Kaikan Bldg. 
Topics (in Japanese) (See Japanese page) 
Topics (in English)  
Paper Information
Registration To ISEC 
Conference Code 2007-05-ISEC 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Correction of "Test for the Longest Run of Ones in a Block" Included in NIST Randomness Test Suite 
Sub Title (in English)  
Keyword(1) Test for the Longest Run of Ones in a Block  
Keyword(2) randomness test  
Keyword(3) NIST SP800-22  
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1st Author's Name Kenji Hamano  
1st Author's Affiliation The University of Tokyo (The Univ. of Tokyo)
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Speaker Author-1 
Date Time 2007-05-18 10:35:00 
Presentation Time 25 minutes 
Registration for ISEC 
Paper # ISEC2007-3 
Volume (vol) vol.107 
Number (no) no.44 
Page pp.17-21 
#Pages 5 
Date of Issue 2007-05-11 (ISEC) 

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