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Paper Abstract and Keywords
Presentation 2007-07-13 14:55
Two-Dimensional Software Reliability Growth Modeling based on a Weibull Process
Shinji Inoue, Shigeru Yamada (Tottori Univ.) R2007-26
Abstract (in Japanese) (See Japanese page) 
(in English) Almost all of the software reliability growth models (SRGMs) has been developed under the assumption that the software reliability growth process in the testing-phase depends only on the testing-time essentially. However, such assumption is doubtful when we consider the software failure-occurrence mechanism. That is, we consider that the software reliability growth process depends not only on the testing-time but also the some other factors which are related to the software reliability growth process. This paper discuss a two-dimensional SRGM in which the software reliability growth process is expressed on the two-dimensional time-space. Especially in this paper, we develop a two-dimensional Weibull process model for software reliability assessment by extending an existing Weibull process model based on a notion of the Cobb-Douglas utility function. Further, we discuss a parameter estimation method of our two-dimensional SRGM, and show numerical examples of our model for two-dimensional software reliability assessment.
Keyword (in Japanese) (See Japanese page) 
(in English) Software reliability assessment / Weibull process / two-dimensional model / software reliability growth factor / testing-coverage / Cobb-Douglas utility function / /  
Reference Info. IEICE Tech. Rep., vol. 107, no. 137, R2007-26, pp. 39-44, July 2007.
Paper # R2007-26 
Date of Issue 2007-07-06 (R) 
ISSN Print edition: ISSN 0913-5685    Online edition: ISSN 2432-6380
Copyright
and
reproduction		 All rights are reserved and no part of this publication may be reproduced or transmitted in any form or by any means, electronic or mechanical, including photocopy, recording, or any information storage and retrieval system, without permission in writing from the publisher. Notwithstanding, instructors are permitted to photocopy isolated articles for noncommercial classroom use without fee. (License No.: 10GA0019/12GB0052/13GB0056/17GB0034/18GB0034)
Download PDF R2007-26

Conference Information
Committee R  
Conference Date 2007-07-13 - 2007-07-13 
Place (in Japanese) (See Japanese page) 
Place (in English) Kitami Institute of Technology 
Topics (in Japanese) (See Japanese page) 
Topics (in English) Reliability Engineering 
Paper Information
Registration To R 
Conference Code 2007-07-R 
Language Japanese 
Title (in Japanese) (See Japanese page) 
Sub Title (in Japanese) (See Japanese page) 
Title (in English) Two-Dimensional Software Reliability Growth Modeling based on a Weibull Process 
Sub Title (in English)  
Keyword(1) Software reliability assessment  
Keyword(2) Weibull process  
Keyword(3) two-dimensional model  
Keyword(4) software reliability growth factor  
Keyword(5) testing-coverage  
Keyword(6) Cobb-Douglas utility function  
Keyword(7)  
Keyword(8)  
1st Author's Name Shinji Inoue  
1st Author's Affiliation Tottori University (Tottori Univ.)
2nd Author's Name Shigeru Yamada  
2nd Author's Affiliation Tottori University (Tottori Univ.)
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Speaker Author-1 
Date Time 2007-07-13 14:55:00 
Presentation Time 25 minutes 
Registration for R 
Paper # R2007-26 
Volume (vol) vol.107 
Number (no) no.137 
Page pp.39-44 
#Pages 6 
Date of Issue 2007-07-06 (R) 

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